This page is a quick overview of the multitechnic and multipurpose goniometer and its large possibilities.
This goniometer at BM32 is specially designed for:
surface X-ray scattering experiments
at energy up to 30keV
on solid or liquid samples
1- Multiple Uses
The goniometer has been designed to allow :
2- Detection and sample environment
Beam collimation :
Detection :
Photodiodes and X-ray camera for intensity normalisation and alignement
Standart sample environment and accessories :
3- Typical and recent experiments
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Study of the buried SiO2 layer between two molecularly bounded Si wafers Reflected intensity allows to study the thickness and the roughness of the Si oxide layer as a function of preparation parameters.
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Study of multilayers of metallic nanoparticles embedded in oxide Grazing Incidence Small Angle Scattering (GISAXS) measurements were done using 2D CCD camera to determine the organization of Co particles in and out of the layers plane. |
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Study of the stress and the texture in submicronic in situ annealed Cu wires Theta-2Theta measurements with respect to tilted Miller planes on textured and crystallised Cu wire show the intensity of the stresses. |
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Study of amphiphilic polymers at the oil-water interface Diffuse scattering by the interfacial layer allows the determination of the structure and fluctuations of the film. |
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Study of Langmuir films Scattered intensity out of the incident plane reveal the in-plane correlations and order of self-organized molecules. |
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