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(#) number of citations (included self-citations):

• in june 2005 for papers  up to 2005
• in march 2010 for papers 2006-2010
• in november 2013 for papers 2011-2013

1998

1. (5) C. Fradin, D. Luzet, A. Braslau, M. Alba, F. Muller, J. Daillant, J.M. Petit and F. Rieutord
   X-ray study of the fluctuations and of the interfacial structure of a phospholipid monolayer at an alkane-waterinterface
   Langmuir 14(26) (1998) 7327
2. (14) M.C. Saint-Lager, R. Baudoing-Savois, M. De Santis, P. Dolle and Y. Gauthier
   Thickness effect on alloying of ultrathin Co films on Pt(111): a real time and in situ UHV study with synchrotron x-ray diffraction
   . Surface Science 418 (1998) 485
3. (104) [Review] G. Renaud
   Oxide surfaces and metal/oxide interfaces studied by grazing incidence X-ray scattering
   Surface Science Reports 32(1-2) (1998) 1-90
4. (29) A. Bourret, A. Barski, J.L. Rouvière, G. Renaud and A. Barbier
   Growth of aluminum nitride on (111) silicon: microstructure and interface structure J. Appl. Phys. 83 (1998) 2003
5. (0) O. Robach, G. Renaud and A. Barbier
   Very-high-quality MgO(001) surfaces : roughness, rumpling and relaxation
   Surf. Sci. 401 (1998) 227
6. (13) G. Renaud, P. Gu\'{e}nard and A. Barbier
   Misfit dislocation network at the Ag/MgO(001) interface{\nobreakspace
   : A grazing-incidence x-ray scattering study} Phys. Rev. B. 58 (1998) 7310
7. (10) A. Barbier, G. Renaud and O. Robach
   Growth, annealing and oxidation of the Ni/MgO(001) interface studied by grazing incidence X-ray scattering
   J. Appl. Phys. 84 (1998) 4259
8. (8) C. Mocuta, A. Barbier, G. Renaud and B. Dieny
   Growth and Magnetism of Co/NiO(111) thin films
   Thin Solid films 336 (1998) 160
9. (3) N. Pelekanos, N. Boudet, J. Eymery and H. Mariette
   Interface roughness correlation in CdTe / CdZnTe strained quantum wells
   J. Cryst. Growth184 (1998) 886
10. (2) E. Lacaze, M. Alba, J. Barre, A. Braslau, M. Goldmann and J. Serreau
    Organic monolayers: Interface between 8CB liquid crystals and MoS2 monocrystal
    , Physica B 248 (1998) 246
11. (24) E.A.L. Mol, G.C.L. Wong, J.M. Petit, F. Rieutord, W.H. de Jeu
    Thinning transitions and fluctuations of freely suspended smectic-A films as studied by specular and diffuse X-ray scattering
    Physica B 248 (1998) 191

1999

12. (19) R. Baudoing-Savois, G. Renaud, M. De Santis, A. Barbier, O. Robach, P. Taunier, P. Jeantet, O. Ulrich, J.P. Roux, M.C. Saint-Lager, A. Barski, O. Geaymond, G. Berard, P. Dolle, M. Noblet and A. Mougin
    A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF
    Nucl. Instrum. Methods Phys. Res B 149 (1999) 213
13. (4) S. Boukari, E. Beaurepaire, H. Bulou, B. Carrière, J.P. Deville, F. Scheurer, R. Baudoing Savois and M. De Santis
    Strain induced epitaxial relationship of Cr on Co/Pd(111)
    Surface Science 430 (1999) 37
14. (2) M. De Santis, R. Baudoing-Savois, P. Dolle, M.C. Saint-Lager and Y. Gauthier
    Long range order in ultra-thin Pt-Co(111) alloys
    Surface Review Letters 6 (1999) 361
15. (2) R. Baudoing-Savois, Y. Gauthier, P. Dolle, M.C. Saint-Lager and M. De Santis
    Co ultra thin films on Pt(111) and Co-Pt alloying : A LEED, Auger and Synchrotron X-ray diffraction study
    Journal of Physic: Condensed Matter 11 (1999) 8355
16. (28) O. Robach, G. Renaud and A. Barbier
    Structure and morphology of the Ag/MgO(001) interface during in situ growth at room temperature
    Phys. Rev. B 60 (1999) 5858
17. (12) G. Renaud, A. Barbier and O. Robach
    Growth, structure and morphology of the Pd/MgO(001) interface: epitaxial site and interfacial distance
    Phys. Rev. B 60 (1999) 5872
18. (5) R. Langer, A. Barski, A. Barbier, G. Reanud, M. Leszczynski, I. Grzegory and S. Porowski
    Strain relaxation in AlN epitaxial layers grown on GaN single crystals
    J. Cryst. Growth 205 (1999) 31
19. (11) D. Buttard, G. Dolino, D. Bellet, T. Baumbach and F. Rieutord
    X-ray reflectivity investigation of thin p-type porous silicon layers
    Solid state commun. 109 (1999) 1
20. (10) J. Eymery, F. Fournel, F. Rieutord, D. Buttard, H. Moriceau and B. Aspar
    X-ray reflectivity of ultrathin twist-bonded silicon wafers
    Appl. phys. lett. 75 (1999) 3509

2000

21. (1) P. Cluzeau, P. Gisse, V. Ravaine, A.-M. Levelut, P. Barois, C.C. Huang, F. Rieutord and H.T. NGuyen
    Resonant X-ray diffraction study of a new brominated chiral SmCA* liquid crystal
    Ferroelectrics 244 (2000) 301
22. (4) G. Fragneto, E. Bellet-Amalric, T. Charitat, P. Dubos, F. Graner and L. Perino-Gallice
    Neutron and X-Ray Reflectivity Studies at Solid-Liquid Interfaces: the Interaction of a Peptide with Model Membranes
    Physica B 276-278 (2000) 501
23. L. Perino-Gallice, E. Bellet-Amalric, A. Braslau, T. Charitat, J. Daillant, G. Fragneto and F. Graner
    Adsorbed and free lipid bilayers at the solid-water interface viewed by specular and off-specular reflectivity
    Prog. Colloid Polym Sci. 115 (2000) 171
24. (6) C.Mocuta, A. Barbier and G. Renaud
    CoO(111) surface study by surface X-ray diffraction
    Appl. Surf. Sci. 162-163 (2000) 56
25. (0) J.P. Deville, A.Barbier, C. Mocuta, G. Renaud, Y. Samson, H. Magna, P. Le Fevre, D. Chandesris, C. Panissod and C. Meny
    Magnetic ultrathin films and mulilayerse
    : growth and characterization} Analusis 28 (2000) 20
26. (26) A.Barbier, C. Mocuta, H. Kuhlenbeck, K.F. Peters, B. Richter and G. Renaud
    Atomic structure of the polar NiO(111)-p(2x2) surface
    Phys. Rev. Lett. 84 (2000) 2897
27. (7) A. Barbier, C. Mocuta and G. Renaud
    Structure, transformation and reduction of the polar NiO(111) surface
    Phys. Rev. B 62 (2000) 16056
28. (0) C. Alonso, F. Artzner, J. Lajzerowicz, G. Grübel, N. Boudet, F. Rieutord, J.M. Petit, A. Renault
    Thermodynamics and X-ray studies of 2-alcohol monolayers: Two-dimensional phase diagrams
    European Physical Journal E 3 (2000) 63
29. (1) P.F. Lenne, F. Bonosi, A. Renault, E. Bellet-Amalric, J.F. Legrand, J.M. Petit, F. Rieutord and F. Berge
    Growth of two-dimensional solids in alcohol monolayers in the presence of soluble amphiphilic molecules
    Langmuir 16 (2000) 2306
30. (21) [Review] J. Daillant and M. Alba High-resolution x-ray scattering measurements: I. Surfaces Reports on progress in physics 53 (10) (2000) 1725

2001

31. (6) S. Marchesini, O. Ulrich, G. Faigel,M. Tegze, M. Belakhovsky, A. S. Simionovici
    Instrumental development of X-ray atomic holography at ESRF
    Nuclear Instruments & Methods in Physics Research A 457 (2001) 601
32. (3) E. Lacaze, M. Alba, M. Goldmann, J.P. Michel and F. Rieutord
    Adsorbed organic monolayers on crystalline substrate: the example of 8CB on MoS2{\textquotedbl
    } Appl Surf. Sci. 175-176 (2001) 337
33. (4) S. Boukari, E. Beaurepaire, H. Bulou, B. Carrière, J.P. Deville, F. Scheurer, M. De Santis, R. Baudoing-Savois
    Influence of strain on the magnetocrystalline anisotropy in epitaxial Cr/Co/Pd(111) films
    Physical Review B 64 (2001) 144431
34. G. Renaud and A. Barbier
    Atomic Structure of Oxide Surfaces by Surface X-ray Scattering
    Chapter 6 of "The Chemical Physics of Solid Surfaces", Volume 9: "Oxide Surfaces", ed. D.P. Woodruff, pp. 256-298 (2001)
35. P. Bayle-Guillemaud, A. Barbier and C. Mocuta
    Development of a quantitative energy filtering TEM method to study a reactive NiO/80Ni20Fe interface
    Ultramicroscopy 88 (2001) 99
36. (2) J. Eymery, F. Rieutord, F. Fournel, D. Buttard and H. Moriceau
    X-ray reflectivity of silicon on insulator wafers
    Materials Science in Semiconductor Processing 4 (2001) 31
37. (9) C. Gourier, M. Alba, A. Braslau, J. Daillant, M. Goldmann, C.M. Knobler, F. Rieutord and G. Zalczer
    Structure and elastic properties of 10-12 pentacosadiyonic acid langmuir films
    Langmuir 17 (2001) 6496
38. (6) F. Rieutord, J. Eymery, F. Fournel, D. Buttard, R. Oeser, O. Plantevin, H. Moriceau and B. Aspar High-energy X-ray reflectivity of buried interfaces created by wafer bonding Physical Review B 63 (2001) 125408
39. (3) V. Chamard, P. Bastie, D. Le Bolloch, G. Dolino, E. Elkaïm, C. Ferrero, J.-P. Lauriat, F. Rieutord and D. Thiaudière
    Evidence for self organization in porous silicon: an x-ray grazing incidence study
    Physical Review B 64 (2001) 245416

2002

40. (0) B. Struth, F. Rieutord, O. Konovalov, G. Brezesinski, G. Grübel and P. Terech
    Organization of two-dimensional phospholipid monolayers on a gel-forming substrate
    Phys. rev. lett. 88 (2002) 025502
41. [Book chapter] G. Fragneto, E. Bellet-Amalric and F. Graner
    Nanometer scale studies of lipid bilayers using neutrons and x-rays
    in "Membrane interacting peptides and proteins", ed. F. Heitz (Research Signpost, Trivandrum, India), pp. 43-66 (2002)
42. (4) J.S. Filhol, M.-C. Saint-Lager, M. De Santis, P. Dolle, D. Simon, R. Baudoing-Savois, J.C. Bertolini and P. Sautet
    Highly strained structure of a four-layer deposit of Pd on Ni(110): A couple theoretical and experimental study
    Phys. Rev. Lett. 89 (2002) 146106
43. (25) E. Lundgren, G. Kresse, C. Klein, M. Borg, J. N. Andersen, M. De Santis, Y. Gauthier, C. Konvicka, M. Schmid, P. Varga
    Two-Dimensional Oxide on Pd(111)
    Phys. Rev. Lett. 88 (2002) 246103
44. (0) M. De Santis, R. Baudoing-Savois, P. Dolle, M. C. Saint-Lager
    Chemical Ordering in the First Stages of Co-Pt film growth on Pt(111)
    Phys. Rev. B 66 (2002) 085412
45. (2) P. Dolle, R. Baudoing-Savois, M. De Santis, M. C. Saint-Lager, M. Abel, J. C. Bertolini, P. Delichere Strained Pd films, by epitaxial growth on Au(110), to control cathalitic proprerties Surface Science 518 (2002) 1
46. (3) O. Fruchart, G. Renaud, J.-P. Deville, A. Barbier, F. Scheurer, M. Klaua, J. Barthel, M. Noblet, O. Ulrich, J. Mane-Mane, J. Kirschner
    Self-organized growth of nanosized flat dots and vertical magnetic Co pillars on Au(111)
    Journal of Crystal Growth 237-239(3) (2002) 2035
47. (3) Vilfan I, Deutsch T, Lancon F, Renaud G, et al.,
    Structure determination of the (3 sqrt(3)X 3 sqrt(3)) reconstructed alpha-Al2O3(0001)
    Surf. Sci. 505, L215-221 (2002)
    (+ Erratum Surface Science 529 (2003) 281)
48. (3) D. Buttard, J. Eymery, F. Fournel, P. Gentille, F. Leroy, N. Magnea, H. Moriceau, G. Renaud, F. Rieutord, K. Rousseau and J.L. Rouviere
    Towards the two dimensional lateral long range order self-organization of nanostructures using patterned silicon surface
    IEEE J. Quant. Elec. 38 (2002) 995
49. A. Barbier, C. Mocuta and G. Renaud
    In situ synchrotron structural studies of the growth of oxides and metals
    Chapter 11 of ``HANDBOOK of THIN FILM MATERIALS'' Vol. 2: ``Characterization and Spectroscopy of thin films'', p 527-596; Ed. : Hari Singh Nalwa; Publisher : Academic Press, 2002.
50. (1) M. Derivaz, P. Noé, R. Dianoux, A. Barski, T. Schülli, T.H. Metzger
    Growth of highly strained germanium dots on Si(001) covered by a silicon nitride layer
    Appl. phys. lett. 81 (2002) 3843
51. (17) R. Lazzari
    IsGISAXS: A program for grazing-incidence small-angle X-ray scattering analysis of supported islands
    J. Appl. Crystallogr. 35 (2002) 406

2003

52. (1) H. Enriquez, M. D'angelo, V.Yu. Aristov, V. derycke, P. Soukassian, G. Renaud, A. Barbier, S. Chiang, F. Semond
    Silicon carbide surface structure investigated by synchrotron radiation-based x-ray diffraction
    Journal of Vacuum Science \& Technology B 21 (2003) 1881
53. (5) M. D'angelo, H. Enriquez, V.Yu. Aristov, P. Soukassian, G. Renaud, A. Barbier, M. Noblet, S. Chiang, F. Semond
    Atomic structure determination of the Si-rich beta -SiC(001) 3*2 surface by grazing-incidence x-ray diffraction: a stress-driven reconstruction
    Physical Review B 68 (2003) 165321
54. (0) M. D'angelo, H. Enriquez, V.Yu. Aristov, P. Soukassian, G. Renaud, A. Barbier, S. Chiang, F. Semond, L. Di Cioccio, T. Billion
    Cubic SiC surface structure studied by X-ray diffraction
    Silicon Carbide and Related Materials -2002- Materials Science Forum. 433-434 (2003) 571
55. (1) C. Ybert, L. Navailles, B. Pansu, F. Rieutord, H.T. Nguyen and P. Barois
    Structural study of the liquid crystal analog of the vortex liquid phase in type II superconductors
    Europhysics Letters 63 (2003) 840
56. (24) G. Renaud, R. Lazzari, C. Revenant, A. Barbier, M. Noblet, O. Ullrich, F. Leroy, Y. Borensztein, J. Jupille, C.R. Henry, J. P. Deville, F. Scheurer, J. Mane-Mane, O. Fruchart
    In situ GISAXS towards a real time modelling of growing nanoparticles
    Science 300 (2003) 1416
57. (1) F. Leroy, J. Eymery, D. Buttard, G. Renaud, R. Lazzari, F. Fournel
    Grazing incidence X-ray scattering investigations of silicon surface patterned with buried dislocation networks
    Appl. Phys. Lett. 82 (2003) 2598
58. G. Fragneto-Cusani
    On how reflectivity studies can help in understanding interactions at cell surfaces
    in "Self Assembly", Ed. B. H. Robinson, IOS Press, Amsterdam, Netherlands (2003) pp. 63-69
59. (1) R. Koller, Y. Gauthier, C. Klein, M. De Santis, M. Schmid, P. Varga
    Structure and composition of Pt50Rh50(110). RT analysis of the (1x3) missing row reconstruction by X-rays, STM, LEIS and LEED
    Surface Science 530 (2003) 121
60. (3) O. Fruchart, G. Renaud, A. Barbier, M. Noblet, O. Ulrich, J.-P. Deville, F. Scheurer, J. Mane-Mane, V. Repain, G. Baudot, S. Rousset
    X -ray super-cell crystallography of self-organized Co/Au(111) deposits
    Europhysics Letters 63 (2003) 275
61. (0) A. Barbier, S. Stanescu, C. Boeglin, J.P. Deville
    Local morphology and correlation lengths of reactive NiO/Cu(111) interfaces
    Phys. rev. B 68 (2003) 245418
62. (0) B. Bataillou, H. Moriceau, F. Rieutord
    Direct inversion of interfacial reflectivity data using the Patterson function
    J. Appl. Crystallogr. 36 (2003) 1352
63. (0) D. Buttard, F. Rieutord, J. Eymery, F. Fournel, B. Bataillou
    Buried hydrophobic silicon interfaces studied by high-energy x-ray reflectivity
    Journal of Physics D: Applied Physics 36(10A) (2003) A205-A208
64. (4) F. Leroy, J. Eymery, P. Gentile, F. Fournel
    Controlled surface nanopatterning with buried dislocation arrays
    Surface Science 545 (2003) 211
65. (2) S. Stanescu, C. Boeglin, A. Barbier, J.P. Deville
    Growth mode of NiO on Cu(111) studied using scanning tunneling microscopy and surface X-ray diffraction
    Phys. rev. B 67 (2003) 035419

2004

66. (3) [Review] P. G. Soukiassian and H. B. Enriquez
    Atomic scale control and understanding of cubic silicon carbide surface reconstructions, nanostructures and nanochemistry
    Journal of Physics : Condensed Matter 16, Special Section on Silicon Carbide (2004) S 1611
67. (0) E. Lacaze, M. Alba, M. Goldmann, J.P. Michel and F. Rieutord
    Dimerization in the commensurate network of 4-n-octyl-4-cyanobiphenyl (8CB) molecules adsorbed on MoS2 single crystal
    Eur. Phys. J. B 39 (2004) 261.
68. (1) M. De Santis, V. Abad-Langlais, Y. Gauthier, P. Dolle
    Growth and structure of the Ni(110)-c(2x2)Mn surface alloy : an X-ray diffraction analysis
    Physical Review B 69 (2004) 115430
69. (5) C. Revenant, F. Leroy, R. Lazzari, G. Renaud and C.R.Henry
    Quantitative analysis of grazing incidence small-angle x-ray scattering: Pd/MgO(001) growth
    Physical Review B 69 (2004) 035411
70. R. Lazzari, G. Renaud and F. Leroy
    Regarder croître les nano-objets
    Bull. Soc. Franc. Phys. 142 (2004) 8
71. (2) C. Mocuta, A. Barbier, S. Lafaye, P. Bayle-Guillemaud, M. Panabière
    Single-crystalline model spin valves using single-crystalline NiO(111) substrates
    Phys. rev. B 68 (2004) 014416
72. (0) C. Mocuta, A. Barbier, G. renaud, M. Panabière, P. Bayle-Guillemaud
    Structure and growth of metal on NiO(111) single crystal interfaces
    Journal of Applied Physics 95 (2004) 2151
73. (0) G. Renaud, M. Ducruet, O. Ulrich, R. Lazzari
    Apparatus for real time in situ quantitative studies of growing nanoparticles by grazing incidence small angle X-ray scattering and surface differential reflectance spectroscopy
    Nucl. Inst. Meth. Phys. Res. B 222 (2004) 667
74. (0) F. Leroy, R. Lazzari and G. Renaud
    Effects of near-neighbor correlations on the diffuse scattering from a one-dimensional paracrystal
    Acta Crystallographica A60 (2004) 565
75. (0) D. Rebiscoul, A. Van der Lee, F. Rieutord, F. Né, O. Spalla, A. El-Mansouri, P. Frugier, A. Ayral, S. Gin
    Morphological evolution of alteration layers formed during nuclear glass alteration: new evidence of a gel as a diffusive barrier
    Journal of Nuclear Materials 326 (2004) 9
76. (1) A. Létoublon,V. Favre-Nicolin, H. Renevier, M.G. Proietti, C. Monat, M. Gendry, O. Marty, C. Priester
    Strain, Size, and Composition of InAs Quantum Sticks Embedded in InP Determined via Grazing Incidence X-Ray Anomalous Diffraction
    Physical Review Letters 92 (2004) 186101
77. D. Baigl, M. A. Guedeau-Boudeville, R. Ober, F. Rieutord, M. Sferrazza, O. Théodoly, T. Waigh, and C. E. Williams
    Adsorption of hydrophobic polyelectrolytes as studied by in situ high energy X-Ray reflectivity
    http://arxiv.org/abs/cond-mat/0403139

2005

78. J. Daillant, E. Bellet-Amalric, A. Braslau, T. Charitat, G. Fragneto, F. Graner, S. Mora, F. Rieutord, B. Stidder
    Structure and fluctuations of a single floating lipid bilayer
    Proc. Nat. Acad. Sci. USA, 102 (33) (2005) 11639
79. N. Jedrecy, G. Renaud, R. Lazzari, J. Jupille
    Flat-top silver nanocrystals on the two polar faces of ZnO: an all angle x-ray scattering investigation
    Phys. Rev. B 72 (2005) 045430
80. M.-C. Saint-Lager, Y. Jugnet, P. Dolle, L. Piccolo, R. Baudoing-Savois, J.C. Bertolini, A. Bailly, O. Robach, C. Walker, S. Ferrer
    Surface structure from surface X-ray diffraction. Surface evolution under hydrogen and butadiene reactants at elevated pressure Pd8Ni92(110)
    Surface Science 587 (2005) 229
81. (0) L. Giovanelli, M. De Santis, G. Panaccione, F. Sirotti, P. Torelli, I. Vobornik, R. Larciprete, S. Egger, M.C. Saint-Lager, P. Dolle and G. Rossi
    Magnetic and electronic properties of a Pt--Co bilayer on Pt(1 1 1)
    J. of Magnetism and Magnetic Materials 288 (2005) 236
82. (0) I. Robinson, M. C. Saint-Lager, P. Dolle, S. Boutet, M. De Santis, R. Baudoing-Savois
    Relaxations in the 1x5 reconstruction of Pt(110)
    Surface Science 575 (2005) 321

2006

83. (30) [1.96] Effect of macromolecular parameters and processing conditions on supramolecular
    organisation, morphology and electrical transport properties in thin layers of regioregular poly(3hexylthiophene)
    VERILHAC JM, LEBLEVENNEC G, DJURADO D, F. RIEUTORD, M. CHOUIKI, J.-P. TRAVERS, A. PRON
    Synthetic Metals 156 (1113) 815-823 2006
84. [7.18] Comment on "Destructive effect of disorder and bias voltage on interface resonance transmission in symmetric tunnel
    junctions"
    TUSCHE, C; MEYERHEIM, HL; JEDRECY, N; RENAUD, G; ERNST, A; HENK, J; BRUNO, P;
    KIRSCHNER, J
    Phys. Rev. Lett. 96 (2006) 119602
85. (1) [1.73] The epitaxial sexiphenyl (001) monolayer on TiO2(110): A grazing incidence Xray
    diffraction study
    R. RESEL, M. OEHZELT, O. LENGYEL, T. HABER, T. SCHÜLLI ET AL.,
    Surf. Sci. 600 (2006) 4645
86. (0) [2.20] Strain and composition of ultrasmall Ge quantum dots studied by xray scattering and in situ
    surface xray absorption spectroscopy
    DUJARDIN, R; POYDENOT, V; SCHULLI, TU; RENAUD, G; ULRICH, O; BARSKI, A; DERIVAZ, M;
    COLONNA, S; METZGER, T
    J. Appl. Phys. 99 (2006) 063510
87. (2) [3.7398] In situ resonant xray study of vertical correlation and capping effects during GaN/AlN quantum dot growth
    CORAUX, J; RENEVIER, H; FAVRENICOLIN, V; RENAUD, G; DAUDIN, B
    Appl. Phys. Lett. 88 (2006) 153125
88. (3) [1.00] Growth of Ag on MgO(001) studied in situ by grazing incidence small angle Xray scattering
    REVENANT, C; RENAUD, G; LAZZARI, R; JUPILLE, J
    Nucl. Inst. & Meth. Phys. Res. B, 246 (2006) 112
89. (0) [0.97] In situ and ex situ grazing incidence diffraction anomalous fine structure study of GaN/AIN
    quantum dots
    CORAUX, J; RENEVIER, H; PROIETTI, MG; FAVRENICOLIN,
    V; DAUDIN, B; RENAUD, G
    Phys. Stat. Sol. B 243 (2006) 1519
90. (1) [1.00] In situ investigation by GISAXS and GIXD of the growth mode, strain state and shape of Ge islands during their
    growth on Si(001)
    RICHARD, MI; SCHULLI, TU; WINTERSBERGER, E; RENAUD, G; BAUER, G
    Nucl. Inst. & Meth. Phys. Res. B 246 (2006) 35
91. (2) [1.67] Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in
    situ GISAXS and GIXD study
    RICHARD, MI; SCHULLI, TU; WINTERSBERGER, E; RENAUD, G; BAUER, G
    Thin Solid Films 508 (2006) 213
92. (6) [3.32] Growth sequence and interface formation in the Fe/MgO/Fe(001) tunnel junction analyzed by surface x-ray
    diffraction
    C. TUSCHE, H. L. MEYERHEIM, N. JEDRECY, G. RENAUD AND J. KIRSCHNER
    Phys. Rev. B 74 (2006) 195422
93. (0) [2.20] Strain and composition of ultrasmall Ge quantum dots studied by x-ray Scattering and in situ surface xray
    absorption spectroscopy
    R. DUJARDIN, V. POYDENOT, T. U. SCHÜLLI, G. RENAUD, O. ULRICH, A. BARSKI, M. DERIVAZ,
    S. COLONNA AND T. METZGER
    J. Appl. Phys. 99 (2006) 063510
94. (2) [3.98] In situ investigation of the island nucleation of Ge on Si(001) using xray scattering methods
    T. U. SCHÜLLI, M.I. RICHARD, G. RENAUD, AND V. FAVRENICOLIN, E. WINTERSBERGER AND
    G. BAUER
    Appl. Phys. Lett. 89 (2006) 143114
95. (2) [1.73] Ge quantum dots growth on nanopatterned Si(001) surface: Morphology and stress relaxation study
    PASCALE A, GENTILE P, EYMERY J, MEZIERE J, BAVARD A, SCHULLI T U, FOURNEL F
    Surf. Sci. (2006) 600 (16): 3187-3193
96. (1) [1.73] Temperature- and coverage-dependent evolution of the Au/Pd(110) surface structure,
    KRALJ M, BAILLY A, SAINT-LAGER MC, DEGEN S., KRUPSKI A., BECKER C., DOLLE P., DE SANTIS M., WANDELT K.,
    Surf. Sci. 600, 2614 (2006)
97. (110) [23.13] High-Curie-temperature ferromagnetism in self-organized Ge1-xMn nanocolumns
    JAMET, M; BARSKI, A; DEVILLERS, T; POYDENOT, V; DUJARDIN, R; BAYLE-GUILLEMAUD, P; ROTHMAN, J; BELLET-
    AMALRIC, E; MARTY, A; CIBERT, J; MATTANA, R; TATARENKO, S
    Nature Materials, Vol. 5, P. 653-659 ( 2006)
98. (11) [2.20] X-ray scattering study of hydrogen implantation in silicon
    SOUSBIE N, CAPELLO L, EYMERY J, ET AL.
    J. Appl. Phys. 99 (2006) 103509
99. (1) [1.23] Surface plasma treatments enabling low temperature direct bonding
    MORICEAU H, RIEUTORD F, MORALES C, ET AL..
    Microsyst. Techn: Micro and Nanosyst. Inform. Stor. Proc. Syst. 12 (2006) 378382
100. (1) [3.64] Long range molecular organization of an organic monolayer grafted on a mineral substrate
     STRUTH B, TERECH P, RIEUTORD F
     Chem. Phys. Chem. 7 (2006) 756-761
101. (3) [1.94] Extension of the resonant scattering technique to liquid crystals without resonant element
     FERNANDES P, BAROIS P, GRELET E, ET AL.
     Eur. Phys. J. E 20 (2006) 81-87
102. (143) [12.93] Nanowirebased onedimensional electronics
     THELANDER C, AGARWAL P, BRONGERSMA S, ET AL.
     Materials Today 9 (2006) 28-35
103. (1) [1.58] X-ray scattering: A powerful probe of lattice strain in materials with small dimensions
     THOMAS O, LOUBENS A, GERGAUD P, ET AL.
     Appl. Surf. Sci. 253 (2006) 182-187
104. (1) [0.16] Residual stress analysis in micro and nanostructured materials by Xray diffraction
     GERGAUD P, GOUDEAU P, SICARDY O, ET AL.
     Int. J. Mat. Prod. Tech. 26 (2006) 354- 371
105. Stresses in copper damascene lines: insitu measurements and finite element analysis
     GERGAUD P, BALDACCI A, RIVERO C, SICARDY O, BOIVIN P, MICHA JS, THOMAS O
     AIP CONFERENCE PROCEEDINGS.
     (2006) (816): 205-210
106. Evolution of Lattice Strain in Hydrogenimplanted Silicon Prior to layer Splitting: An Xray
     Scattering study
     L. CAPELLO, F. RIEUTORD, A. TAUZIN, F. MAZEN, N. SOUSBIE, F. LETERTRE
     ECS Transactions, vol. 6, 119-127 (2006)
107. (5) [1.73] Ge quantum dots growth on nanopatterned Si(001) surface: Morphology and stress relaxation study
     PASCALE A, GENTILE P, EYMERY J, MEZIERE J, BAVARD A, SCHULLI T U, FOURNEL F
     Surf. Sci. (2006) 600 (16): 3187-93
108. Rough Surface Adhesion Mechanisms for Wafer Bonding
     F. RIEUTORD, L. CAPELLO, R. BENEYTON, C. MORALES, A.M. CHARVET, H. MORICEAU
     Semiconductor Wafer Bonding 9: Science, Technology, And Applications
     ECS Transactions, vol. 3, ECS Transactions, 2006, 205-215
109. Effect of prebonding surface treatment on SiSi Direct Bonding: Bonding void decrease
     R. BENEYTON, F. FOURNEL, F. RIEUTORD, C. MORALES, H. MORICEAU
     ECS Transactions, vol. 6, pp. 239-248, 2006

2007

110. (20) [10.37] Grazing incidence X-ray measurements of epitaxial InAs/InP nanowires.
     J. EYMERY, F. RIEUTORD, V. FAVRE-NICOLIN, O. ROBACH, L. FRÖBERG, T. MÅRTENSSON, and L. SAMUELSON
     Nano Letters 7 (2007) 2596–2601
111. (10) [3.32] Self-similarity during growth of the Au/TiO2(110) model catalyst as seen by the scattering of x-rays at grazing-
     angle incidence
     R. LAZZARI, G. RENAUD, J. JUPILLE, AND F. LEROY
     Phys. Rev. B 76 (2007) 125412
112. (9) [3.32] Grazing-incidence small-angle x-ray scattering from dense packing of islands on surfaces: Development of
     distorted wave Born approximation and correlation between particle sizes and spacing
     R. LAZZARI, F. LEROY, AND G. RENAUD
     Phys. Rev. B 76 (2007) 125411
113. (10) [3.32] Size and temperature dependent epitaxy for a strong film substrate mismatch : the case of Pt/MgO(001)
     J. OLANDER, R. LAZZARI, J. JUPILLE, B. MANGILI, J. GONIAKOWSKI, G. RENAUD
     Phys. Rev. B 76 (2007) 075409
114. (1) [3.32] Structure and magnetic properties of Mn/Pt(110)-(1x2): a joint x-ray diffraction and theoretical study
     M. DE SANTIS, Y. GAUTHIER, H. C. N. TOLENTINO, G. BIHLMAYER, S. BLÜGEL, V. LANGLAIS,
     Phys. Rev. B 75, 205432 (2007)
115. (1) [3.32] Role of hydrogen interaction in two-dimensional molecular packing with strong molecule-substrate bonding
     V. LANGLAIS, X. TORRELLES, Y. GAUTHIER, M. DE SANTIS,
     Phys. Rev. B 76, 035433 (2007)
116. (7) [1.73] X-ray scattering from stepped and kinked surfaces: An approach with the paracrystal model
     LEROY F, LAZZARI R, RENAUD G
     Surf. Sci. 601 (2007) 1915-1929
117. (4) [1.73] Nanostructuration of a CoO film by misfit dislocations
     P. TORELLI, E. A. SOARES, G. RENAUD, S. VALERI, X. X. GUO AND P. LUCHES
     Surf. Sci. 601 (2007) 2651-2655
118. (6) [1.73] Structural and morphological evolution of Co on faceted Pt/W(111) surface upon thermal annealing
     C. REVENANT, F. LEROY, G. RENAUD, R. LAZZARI, A. LETOUBLON, T. MADEY
     Surf. Sci. 601 (2007) 3431
119. [1.73] Chlorine chemisorption on Cu(001) by surface X-ray diffraction: Geometry and substrate relaxation
     H. C. N. TOLENTINO, M. DE SANTIS, Y. GAUTHIER, V. LANGLAIS,
     Surf. Science 601 (2007) 2962-2966
120. [1.73] Surface structure and composition of the missing-row reconstruction of VC0.8(110): A LEED, GIXRD and
     photoemission study
     Y. GAUTHIER, I. ZASADA, M. DE SANTIS, V. LANGLAIS, C. VIROJANADARA,
     Surf. Science 601 (2007) 3383-3394
121. Structure of the 3C-SiC(100)-5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence
     X-ray Diffraction
     M. SILLY, H. ENRIQUEZ, J. ROY, M. D’ANGELO, P. SOUKIASSIAN, T. SCHÜLLI, M. NOBLET AND G. RENAUD
     Mater. Sci. Forum 556-557, 533 (2007)
122. [4.10] Unexpected stability of phospholipid langmuir monolayers deposited on triton X-100 aqueous solutions
     P. FONTAINE, M.C. FAURE, F. MULLER, M. POUJADE, J.S. MICHA, F. RIEUTORD, M. GOLDMANN
     Langmuir 23(26), 12959 (2007)
123. (11) [3.73] Strain field in silicon on insulator lines using high resolution x-ray diffraction
     GAILHANOU M, LOUBENS A, MICHA JS, CHARLET B., MINKEVICH AA, FORTUNIER R., THOMAS O.
     Appl. Phys. Lett. 90 (2007) 111914
124. (8) [3.32] Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm
     MINKEVICH AA, GAILHANOU M, MICHA JS, CHARLET B., CHAMARD V., THOMAS O.
     Phys. Rev. B 76 (2007) 104106
125. (1) [2.20] Quantitative study of hydrogen-implantation-induced cavities in silicon by grazing incidence small angle x-ray
     scattering
     L. CAPELLO, F. RIEUTORD, A. TAUZIN, F. MAZEN
     J. Appl. Phys. 102 (2007) 026106
126. (4) [1.74] New reactor dedicated to in operando studies of model catalysts by means of surface x-ray diffraction and grazing
     incidence small angle x-ray scattering
     M.-C. SAINT-LAGER, A. BAILLY, P. DOLLE, R. BAUDOING-SAVOIS, P. TAUNIER, S. GARAUDÉE, S. CUCCARO, S.
     DOUILLET, O. GEAYMOND, G. PERROUX, O. TISSOT, J.-S. MICHA, O. ULRICH, and F. RIEUTORD
     Rev. Sci. Instrum. 78 (2007) 083902
127. (1) [1.45] Water penetration mechanisms in nuclear glasses by X-ray and neutron reflectometry
     REBISCOUL D, RIEUTORD F, NE F, FRUGIER P,CUBITT R, GIN S
     J. Non Cryst. Solids 353 (2007) 2221-2230
128. (5) [1.21] Investigation by High Resolution X-ray Diffraction of the local strains induced in Si by periodic arrays of oxide filled trenches
     EBERLEIN M, ESCOUBAS S, GAILHANOU M, THOMAS O., MICHA JS, ROHR P., COPPARD R.
     Phys. Stat. Sol. A 204 (2007) 2542-2547

2008

129. (22) [28,1] Shape Changes of Supported Rh Nanoparticles During Oxidation and Reduction Cycles
     P. NOLTE, A. STIERLE, N. Y. JIN-PHILLIPP, N. KASPER, T. U. SCHULLI, H. DOSCH,
     Science 321, 1654 (2008)
130. (6) [7,18] Depth Magnetization Profile of a Perpendicular Exchange Coupled System by Soft X-ray Resonant Magnetic
     Reflectivity
     J. M. TONNERRE, M. DE SANTIS, S. GRENIER, H.C.N. TOLENTINO, V. LANGLAIS, E. BONTEMPI, M. GARCIA-
     FERNANDEZ, AND U. STAUB
     Phys. Rev. Lett. 100, 157202 (2008)
131. (4) [7,18] Controlling structure and morphology of CoPt nanoparticles through dynamical or static coalescence effects
     J. PENUELAS, P. ANDREAZZA, C. ANDREAZZA-VIGNOLLE, H.C.N. TOLENTINO, M. DE SANTIS, AND C. MOTTET
     Phys. Rev. Lett. 100, 115502 (2008)
132. [3.32] Structure and morphology of thin MgO films on Mo(001)
     S. BENEDETTI, P. TORELLI, S. VALERI, H.M. BENIA, N. NILIUS, G. RENAUD
     Phys. Rev. B 78, 195411 (2008)
133. (5) [3.32] Kink ordering and organized growth of Co clusters on a stepped Au(111) surface: A combined GISAXS, GIXD and
     STM study
     F. LEROY, G. RENAUD, A. LÉTOUBLON, A. ROHART, Y. GIRARD, V. REPAIN, S. ROUSSET, A. COATTI, Y. GARREAU
     Phys. Rev. B 77, 045430 (2008)
134. (4)[3.32] Growth of Co on Au(111) studied by multiwavelength anomalous grazing-incidence small-angle x-ray scattering:
     From ordered nanostructures to percolated thin films and nanopillars
     F. LEROY, G. RENAUD, A. LETOUBLON, R. LAZZARI,
     Phys. Rev. B 77, 235429 (2008)
135. (6) [3.32] Self-organized growth of Ni clusters on a cobalt-oxide thin film induced by a buried misfit dislocation network
     P. TORELLI, E.A. SOARES, G. RENAUD, L. GRAGNANIELLO, S. VALERI, X. GUO AND P. LUCHES,
     Phys. Rev. B 77, 081409(R) (2008)
136. (1) [1.73] Coalescence of domes and superdomes at a low growth rate or during annealing: Towards the formation of flat-
     top superdomes
     M.-I. RICHARD, G. CHEN, T.U. SCHÜLLI, G. RENAUD, G. BAUER,
     Surf Sci. 602, 2157 (2008)
137. (2) [1.73] Structural investigation of silicon nanowires using GIXD and GISAXS: Evidence of complex saw-tooth faceting
     T. DAVID, D. BUTTARD, T. SCHÜLLI, F. DALLHUIN, P. GENTILE
     Surf. Sci 602, 2675 (2008)
138. (1) [1.58] Real time investigation of the growth ofsilicon carbide nanocrystals on Si(100) using synchrotron X-ray diffraction
     S. MILITA, M. DE SANTIS, D. JONES, A. PARISINI, V. PALERMO,
     Applied Surface Science 254 (7), 2162 (2008)
139. [3.73] Germanium oxynitride (GeOxNy) as a back interface passivation layer for Germanium-on-insulator substrates
     T. SIGNAMARCHEIX, F. ALLIBERT, F. LETERTRE, T. CHEVOLLEAU, L. SANCHEZ, E. AUGENDRE, C. DEGUET, H.
     MORICEAU, L. CLAVELIER, F. RIEUTORD
     Appl. Phys. Lett. 93 (2), 022109 (2008)
140. (11) [3.73] Spontaneous compliance of the InP/SrTiO3 heterointerface
     G. SAINT-GIRONS, C. PRIESTER, P. REGRENY, G. PATRIARCHE, L. LARGEAU, V. FAVRE-NICOLIN, G. XU, Y.
     ROBACH, M. GENDRY, G. HOLLINGER
     Appl. Phys. Lett. 92, 241907 (2008)
141. (3) [1.90] Effects of thermal annealing on C/FePt granular multilayers: in situ and ex situ studies
     D. BABONNEAU, G. ABADIAS, J. TOUDERT, T. GIRARDEAU, E. FONDA, J.-S. MICHA and F. PETROFF,
     J. Phys : Cond. Mat. 20, 035218 (2008)
142. [2.00] Looking by grazing incidence small angle x-ray scattering at gold nanoparticles supported on rutile TiO2(110) during
     CO oxidation
     M.C. SAINT-LAGER, A. BAILLY, M. MANTILLA, S. GARAUDEE, R. LAZZARI, P. DOLLE, O. ROBACH, J. JUPILLE, I.
     LAOUFI, P. TAUNIER
     Gold Bulletin 41, 159 (2008)
143. (3) [2.20] Hydrophilic low temperature direct wafer bonding
     C. VENTOSA, F. RIEUTORD, L. LIBRALESSO, C. MORALES, F. FOURNEL, H. MORICEAU,
     J. Appl. Phys. 104 123524 (2008)
144. The phase problem in x-ray reflectivity
     F. Rieutord
     in X-ray and neutron reflectivity edited by A. Gibaud and J. Daillant (Springer, Berlin, 2008)

2009

145. [18.0] (47) Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray
     Scattering
     G. Renaud, R. Lazzari and F. Leroy
     Surf. Sci. Rep. 64 255-380 (2009)
146. [7.2] (35) Enhanced Relaxation and Intermixing in Ge Islands Grown on Pit-Patterned Si(001)
     Substrates
     T. U. Schülli, G. Vastola, M.-I. Richard, A. Malachias, G. Renaud, F. Uhlik, F. Montalenti, G. Chen,
     L.Miglio, F. Schäffler, G. Bauer
     Phys. Rev. Lett. 102, 025502 (2009)
147. [3.9] (4) Multiple scattering effects in strain and composition analysis of nanoislands by grazing
     incidence x-rays
     M.-I. Richard, V. Favre-Nicolin, G. Renaud, T. Schülli, C. Priester, Z. Zhong and T.-H. Metzger
     Appl. Phys. Lett. 94, 013112 (2009)
148. [3.9] (3) X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs
     nanowires
     J. Eymery, V. Favre-Nicolin, L. Froberg and L. Samuelson
     Appl. Phys. Lett. 94 131911 (2009)
149. [3.9] (3) A model of interface defect formation in silicon wafer bonding
     S. Vincent, I. Radu, D. Landru, F. Letertre, F. Rieutord
     Appl. Phys. Lett. 94 (10) 101914 (2009)
150. [3.8] (20) Nucleation mechanism of GaN nanowires grown on (111) Si my molecular beam epitaxy
     O. Landré, C. Bougerol, H. Renevier and B. Daudin
     Nanotechnology 20 415602 (2009)
151. [3.4] (9) In situ x-ray scattering study on the evolution of Ge island morphology and relaxation for
     low growth rate: advanced transition to superdomes
     M.-I. Richard, T. U. Schülli, G. Renaud, E. Wintersberger, G. Chen, G. Bauer and V. Holy
     Phys. Rev. B 80, 045313 (2009)
152. [3.4] (3) Defect-pinned nucleation, growth and dynamic coalescence of Ag islands on MgO(001): An
     in situ grazing-incidence small-angle x-ray scattering study
     C. REVENANT, G. RENAUD, R. LAZZARI AND J. JUPILLE,
     Phys. Rev. B 79, 235424 (2009)
153. [3.4] (11) Adhesion of growing nanoparticles at a glance: Surface differential reflectivity
     spectroscopy and grazing incidence small angle x-ray scattering
     R. LAZZARI, G. RENAUD, C. REVENANT, J. JUPILLE AND Y. BORENSZTEIN,
     Phys. Rev. B 79, 125428 (2009)
154. [2.7] (2) Prebonding Thermal Treatment in Direct Si-Si Hydrophilic Wafer Bonding
     C. Ventosa, F. Rieutord, L. Libralesso, F. Fournel, C. Morales, H. Moriceau
     J. Electrochem. Soc. 156 (11) H818 (2009)
155. [2.2] (4) Hydrated cholesterol: Phospholipid domains probed by synchrotron radiation
     Solomonov I, Daillant J, Fragneto G, Kjaer K, Micha J.S., Rieutord F, Leiserowitz L
     Euro. Phys. J. E 30 215 (2009
156. [2.2] (8) Elastic relaxation in patterned and implanted strained silicon on insulator
     S. Baudot, F. Andrieu, F. Rieutord, J. Eymery
     J. Appl. Phys. 105 (11) 114302 (2009)
157. [2.2] (1) Mechanism of Thermal Silicon Oxide Direct Wafer Bonding
     C. Ventosa, C. Morales, L. Libralesso, F. Fournel, A.M. Papon, D. Lafond, H. Moriceau, J.D. Penot,
     F. Rieutord
     Electrochem. Solid State Lett. 12 (10) H373 (2009)
158. [0.9] (3) Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and
     multiwavelength anomalous diffraction
     M.-I. RICHARD, N.A. KATCH, M.G. PROIETTI, H. RENEVIER, V. FAVRE-NICOLIN, Z.
     ZHONG, G. CHEN, M. STOFFEL, O. Schmidt, G. Renaud, T.U. Schülli and G. Bauer
     Eur. Phys. J. Special Topics 167, 3 (2009)
159. [0.9] (4) Real-time icosahedral to fcc structure transition during CoPt nanoparticles formation
     Penuelas J, Andreaaza P, Andreazza-Vignolle C, Mottet C, De Santis M and Tolentino HCN
     Eur. Phys. J. Special Topics 167 p19-25, (2009)
160. [0.5] Structure, morphology and magnetism of an ultra-thin [NiO/CoO]/PtCo bilayer with
     perpendicular exchange bias
     H. C. N. Tolentino, M. De Santis, J.-M. Tonnerre, A. Y. Ramos, V. Langlais, S. Grenier, A. Bailly
     Brazilian Journal of Physics 39 p150 (2009)
161. Towards synchrotron-based nanocharacterization
     P. Bleuet, L. Arnaud, X. Biquard, P. Cloetens, L. Doyen, P. Gergaud, P. Lamontagne, M. Lavayssière,
     J.-S. Micha, O. Renault, F. Rieutord, J. Susini, O. Ulrich
     AIP Conf. Proc. 1173 181 (2009)

2010

162. [36.2] (12) Substrate-enhanced supercooling in AuSi eutectic droplets
     T.U. Schülli, R. Daudin, G. Renaud, A. Vaysset, O. Geaymond and A. Pasturel,
     Nature 464, 1174 (2010)
163. [5.0] (1) Nanoscale Patterning by C60 Ordering on Pt(110)
     Torrelles X, Langlais V, De Santis M, Tolentino HCN et al.
     J. Phys. Chem. C 114 p 15645 (2010)
164. [4.0] (1) Growth, structure and magnetic properties of FePt nanostructures on NaCl(001) and
     MgO(001)
     Liscio F., Makarov D., Maret M., Doisneau-au-cottignies B., Roussel H., Albrecht M.
     Nanotechnology 21 (6) 065602 (2010)
165. [3.4] (1) Strain and correlation of self-organized Ge(1-x)Mn(x) nanocolumns embedded in Ge (001)
     Tardif S., Favre-Nicolin V., Lancon F., et al.
     Phys. Rev. B 82 (10) 104101 (2010)
166. [3.4] (2) Elastic strain relaxation in GaN/AlN nanowire superlattice
     O. Landré, D. Camacho, C. Bougerol, Y.M. Niquet, V. Favre-Nicolin, G. Renaud, H. Renevier and B.
     Daudin
     Phys. Rev. B 81 153306 (2010)
167. [3.4] (1) Probing nanoscale structural and order/disorder phase transitions of supported Co-Pt
     clusters under annealing
     P. Andreazza, C. Mottet, C. Andreazza-Vignolle, J. Penuelas, H. C. N. Tolentino, M. De Santis, R.
     Felici and N. Bouet
     Phys. Rev. B 82 (15) 155453 (2010)
168. [3.4] (6) Highly ordered growth of Fe and Co clusters on alumina on Ni3Al(111)
     A. Buchsbaum, M. De Santis, H.C.N. Tolentino, M. Schmid and P. Varga
     Phys. Rev. B 81 (11) 115420 (2010)
169. [3.4] (6) Nanostructuring surfaces: Deconstruction of the Pt(110)-(1 X 2) surface by C-60
     X. Torrelles, V. Langlais, M. De Santis, H.C.N. Tolentino and Y. Gauthier
     Phys. Rev. B 81 041404(R) (2010)
170. [2.1] (2) Confinement induced phase transition in a DNA-lipid hydrated complex
     E. Andreoli de Oliveira , E. R. Teixeira da Silva, A. Fevrier, E. Grelet, F. Nallet and L. Navailles
     Europhysics Letters 91 (2) 28001 (2010)
171. [2.0] (4) Supported bilayers: Combined specular and diffuse X-ray scattering
     Malaquin L, Charitat T and Daillant J
     Euro. Phys. J. E 31 p 285 (2010)
172. [2.2] (1) Study of the formation, evolution and dissolution of interfacial defects in silicon wafer
     bonding
     S. Vincent, J. D. Penot, I. Radu, F. Letertre, and F. Rieutord,
     J. Appl. Phys. 107 093513 (2010)
173. [2.1] (1) Influence of the U₃O₇ domain structure on cracking during the oxidation of UO₂
     Desgranges, L, Palancher, H, Gamaleri, M, Micha JS., Optasanu V, Raceanu L, Montesin T, Creton N.
     J. Nucl. Mat. 402 p 167 (2010)
174. [1.5] X-ray microbeam strain investigation on Cu-MEMS structures
     Perroud O, Vayrette R, Rivero C, Thomas O, Micha J.-S., Ulrich O
     Microelectronic Engineering 87 p 394 (2010)
175. [1.5] Physics of Cu/Cu direct bonding: Applications to 3D heterogeneous or monolithic integration
     P. Gueguen, C. Ventosa, L. Di Cioccio, H. Moriceau, F. Grossi, M. Rivoire, P. Leduc and L. Clavelier
     Microelectronic Engineering 87 p 477-484 (2010
176. [1.2] A ferromagnetic semiconductor for spin injection in silicon
     Jamet, T. Devillers, I-S. Yu, A. Barski, P. Bayle-Guillemaud, J. Rothman, V. Favre-Nicolin, S. Tardif,
     S. Cherifi, J. Cibert, L. Grenet, P. Noé and V. Calvo (Ge,Mn)
     Int. J. Nanotechnol., Vol. 7 (2010), 575
177. [1.1] (4) Determination of global and local residual stresses in SOFC by X-ray diffraction
     Villanova J, Sicardy O, Fortunier R, Micha J.S., Bleuet P
     Nucl. Inst. Meth. Phys. B 268 p 282 (2010)
178. Stress field in deformed polycrystals at the micron scale
     Castelnau, O, Bornert, M., Robach, O., Micha, J. -S.,Ulrich, O., Chiron, R.,Le Bourlot, C.
     ICEM 14: 14th International Conference on experimental mechanics
     Book Series: EPJ Web of Conferences 6 35005 (2010)
179. Defect formation at hydrophilic silicon bonding interfaces
     F. Rieutord, S. Vincent, J. D. Penot, H. Moriceau, and I. Radu,
     ECS Transactions, 33 p 451(2010)
180. Efficiency of H2O diffusion barriers at Si-Si direct bonding interfaces
     H. Moriceau, F. Rieutord, L. Libralesso, C. Ventosa, F. Fournel, C. Morales, T. Mc Cormick, T.
     Chevolleau, and I. Radu
     ECS Transactions 33 p467 (2010)
181. Single Crystal Silicon Film Transfer onto polymer
     M. Argoud, H. Moriceau, C. Fretigny, F. Rieutord, C. Morales, and L. Clavelier
     ECS Transactions 33 p217 (2010)
182. Overview on recent direct wafer bonding advances and applications
     H. Moriceau, F. Rieutord, F. Fournel, Y. Le Tiec, and L. Di Cioccio
     in The 5th International Workshop on Advanced Materials Science and Nanotechnology
     (IWAMSN2010) Hanoi (2010)
183. Stress field in deformed polycrystals at the micron scale
     Castelnau, O ; Bornert, M ; Robach, O ; Micha, JS ; Ulrich, O ; Chiron, R ; Le Bourlot, C
     ICEM 14: 14TH INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS, VOL
     6 Book Series: EPJ Web of Conferences Volume: 6 Article Number: 35005
184. Chapter 10: Nanostructures in the light of synchrotron radiation: Surface sensitive x-ray techniques and anomalous scattering
     T. METZGER, V. FAVRE-NICOLIN, G. RENAUD, H. RENEVIER, T. SCHÜLLI
     in : « Characterization of Semiconductor Heterostructures and Nanostructures »
     Edited by C. Lamberti, Elsevier 2008, p 361-403

2011

185. [14.1] (25) M-plane core-shell InGaN/GaN multiple-quantum-well on GaN wires for electroluminescent device
     R. Koester, J. S. Hwang, D. Salomon, X. Chen, C. Bougerol, J.-P. Barnes, D. Le Si Dang, L. Rigutti, M. Tchernycheva, C. Durand and J. Eymery
     Nano Letters 11, p 4839-4845 (2011)
186. [4.5] (7) Full local elastic strain tensor from Laue microdiffraction: simultaneous Laue pattern and spot energy measurement
     O. Robach, J.-S. Micha, O. Ulrich and P. Gergaud
     J. Appl. Cryst.. 44 p 688–696 (2011)
187. [5.2] (27) Size and Catalytic Activity of Supported Gold Nanoparticles: An in operando Study during CO Oxidation
     I. Laoufi, M.-C. Saint-Lager, R. Lazzari, J. Jupille, O. Robach, S. Garaudee, G. Cabailh, P. Dolle, H. Cruguel, A. Bailly
     J. Phys. Chem. C 115 (11) pp 4673-4679 (2011)
188. [5.2] (11) Competition between polar and nonpolar growth of MgO films on Au(111)
     S. Benedetti , N. Nilius, P. Myrach, P. Torelli, G. Renaud, H.-J. Freund, S. Valeri
     J. Phys. Chem. C 115, 23043 (2011)
189. [5.0] (3) In situ grazing-incidence X-ray diffraction during electrodeposition of birnessite thin films: Identification of solid precursors
     M. Ndjeri, S. Peulon, M.L. Schlegel, A. Chaussé
     Electrochem. Commun. 13, (5) p 491-494 (2011)
190. [4.4] (3) In situ synchrotron analysis of lattice rotations in individual grains during stress-induced martensitic transformations in a polycrystalline CuAlBe shape memory alloy
     Berveiller S., Malard B., Wright J., et al.
     Acta Mater. 59 (9) p 3636-3645 (2011)
191. [4.4] (4) Impact of instrumental constraints and imperfections on the dislocation structure in micron-sized Cu compression pillars
     Kirchlechner C., Keckes J., Motz C., Grosinger W., Kapp M.W., Micha J.S., Ulrich O. and Dehm G.
     Acta Mater. 59 (14) p 5618-5626 (2011)
192. [4.1] (6) Catalytic properties of supported gold nanoparticles: new insights into the size-activity relationship gained from in operando measurements
     M.-C. Saint-Lager, I. Laoufi, A. Bailly, O. Robach, S. Garaudée and P. Dolle
     Faraday Discuss., 152, p253–265 (2011)
193. [3.8] (3) Effect of doping on global and local order in crystalline GeTe
     Biquard X., Krbal M., Kolobov A. V. et al
     Appl. Phys. Lett. 98 (23) 231907 (2011)
194. [3.8] (1) In situ x-ray study of the formation of defects in Ge islands on Si(001)
     M.-I. Richard, T. U. Schülli, and G. Renaud
     Appl. Phys. Lett. 99 161905 (2011)
195. [3.8] (7) Catalyst-free growth of high-optical quality GaN nanowires by metal-organic vapor phase epitaxy
     X.J. Chen, B. Gayral, D. Sam-Giao, C. Bougerol, C. Durand and J. Eymery
     Appl. Phys. Lett. 99 (25) 251910 (2011)
196. [4.0] Metal positioning using dislocation arrays.
     A. Bavard, F. Fournel and J. Eymery
     Nanotechnology 22, 215301(2011)
197. [3.6] (2) Twins and their boundaries during homoepitaxy on Ir(111)
     S. Bleikamp, J. Coraux, O. Robach, G. Renaud and T. Michely,
     Phys. Rev. B 83 064103 (2011)
198. [3.6] (4) Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis
     M.I. Richard, A. Malachias, J.-L. Rouvière, T.-S. Yoon, E. Holmström, Y.-H. Xie, V. Favre-Nicolin, V. Holy, K. Nordlund, G. Renaud, T.-H. Metzger
     Phys. Rev. B 84, 075314 (2011)
199. [3.6] (4) Atomic structure and composition of the 2 × N reconstruction of the Ge wetting layer on Si(001) investigated by surface x-ray diffraction
     T. Zhou, G. Renaud, J. Issartel, C. Revenant, T.U. Schülli, R. Felici and A. Malachias,
     Phys. Rev. B 83, 195426 (2011)
200. [2.6] H₂O diffusion barriers at Si-Si Direct bonding interfaces for low temperature anneals
     H. Moriceau, F. Rieutord, L. Libralesso, C. Ventosa, F. Fournel, C. Morales, T. Mc Cormick, T. Chevolleau and I. Radu
     J. Electrochem. Soc. 158 (9) H919 (2011)
201. [2.6] (1) An overview of patterned metal/dielectric surface bonding: mechanism, alignment and characterization
     L. Di Cioccio, P. Gueguen, R. Taibi, D. Landru, G. Gaudin, C. Chappaz, F. Rieutord, F. de Crecy, I. Radu, L.-L. Chapelon, and L. Clavelier
     J. Electrochemical Soc. 158 (6) P81-86 (2011)
202. [2.2] (1) Highly anisotropic epitaxial (L1)0 FePt on Pt(001)
     Soares M.M., Tolentino H.C.N., De Santis M., Ramos A.Y., Cezar J.C.
     J. Appl. Phys. 109 p.07D725-1-07D725-3 (2011)
203. [2.2] (4) Structure and magnetism of Ge3Mn5 clusters
     A. Jain, M. Jamet, A. Barski, T. Devillers, I.-S. Yu, C. Porret, P. Bayle-Guillemaud, V. Favre-Nicolin, S. Gambarelli, V. Maurel, G. Desfonds, J. F. Jacquot, and S. Tardif
     J. Appl. Phys. 109, 013911 (2011)
204. [1.8] (5) In Situ μLaue: Instrumental Setup for the Deformation of Micron Sized Samples
     C. Kirchlechner, J. Keckes, J.-S.Micha and G. Dehm
     Advanced Engineering Materials 13 (8) p 837-844 (2011)
205. [1.7] (11) A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility
     O. Ulrich, X. Biquard, P. Bleuet, O. Geaymond, P. Gergaud, J. S. Micha, O. Robach, and F. Rieutord
     Rev. Sci. Instrum. 82, 033908 (2011)
206. [1.5] (15) Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction
     C. Kirchlechner, D. Kiener, C. Motz, S. Labat, N. Vaxelaire, O. Perroud, J. -S. Micha, O. Ulrich, O. Thomas, G. Dehm, and J. Keckes
     Phil. Mag. 91 (7-9) Special Issue p 1256-1264 (2011)
207. [1.3] Water management on semiconductor surfaces
     Y. Le Tiec, C. Ventosa, N. Rochat, F. Fournel, H. Moriceau, L. Clavelier, F. Rieutord, J. Butterbaugh, and I. Radu
     Microelectronic Engineering 88, p3432-3436 (2011)
208. [1.2] Combined In Situ Grazing Incidence Small Angle X-Ray Scattering and Grazing Incidence X-Ray Diffraction Study of the Growth of Ge Islands on Pit-Patterned Si(001) Substrates
     M.-I. Richard, T. Schülli, G. Renaud, Z.-Z. Zhong and G. Bauer
     J. Nanoscience & Nanotechnology 11, 9123 (2011)
209. [1.1] (4) Analysis of strain error sources in micro-beam Laue diffraction
     F. Hofmann, S. Eve, J. Belnoue, J.-S. Micha, and A.M. Korsunsky
     Nucl. Instrum. Meth. A 660 (1) p 130-137 (2011)
210. (1) X-Ray diffraction determination of macro and micro stresses in SOFC electrolyte and evolution with redox cycling of the anode
     Villanova J., Sicardy O., Fortunier R., Micha J.S., Bleuet P.
     Materials Science Forum, vol. 681, p.25-30 (2011)
211. X-ray Diffraction analysis of elastic strains at the nanoscale
     O. Thomas, O. Robach, S. Escoubas, JS. Micha, N. Vaxelaire, O. Perroud
     Chapter in “Mechanical stress on the nanoscale : simulation, material systems and
     characterization techniques”
     Ed. : M. Hanbücken, P. Müller, U. Gösele, R. B. Wehrspohn, Wiley-VCH Books, 2011

2012

212. [10.6] (1) Controlling Interactions in supported bilayers from weak electrostatic repulsion to high osmotic pressure
     A. Hemmerle, L. Malaquin , T. Charitat,, S. Lecuyer, G. Fragneto and J. Daillant
     Proc. Nat. Acad. Sciences USA 109 (49) 19938-19942 (2012)
213. [6.2] (3) From metastable to stable modifications—in situ Laue diffraction investigation of diffusion processes during the phase transitions of (GeTe)nSb2Te3 (6 <= n <= 15) crystals
     M. N. Schneider, X. Biquard, C. Stiewe, T. Schröder, P. Urban and O. Oeckler
     Chemical Communications 48 (16) 2192-2194 (2012)
214. [5.2] (3) CO-Induced Scavenging of Supported Pt Nanoclusters: A GISAXS Study
     N. Chaabane, R. Lazzari, J. Jupille, G. Renaud, and E. A. Soares
     J. Phys. Chem. C, 116 (44), 23361-23370 (2012)
215. [4.5] (1) Strains in light ion implanted polycrystals: influence of grain orientation
     A. Richard, H. Palancher, E. Castelier, J. S. Micha, M. Gamaleri, G. Carlot, H. Rouquette, P.
     Goudeau, G. Martin, F. Rieutord, J. P. Piron and P. Garcia
     J. Appl. Cryst. 45 (4) 826-833 (2012)
216. [4.5] (1) Multi scale measurements of residual strains in stabilized zirconia layer
     J. Villanova, C. Maurice, J.-S. Micha, P. Bleuet, O. Sicardy and R. Fortunier
     J. Appl. Cryst. 45 (5) p 926-935. (2012)
217. [4.4] (3) Expected and unexpected plastic behavior at the micron scale: An in situ Laue tensile study
     C. Kirchlechner , P.J. Imrich, W. Grosinger, M.W. Kapp, J. Keckes, J.S. Micha, O. Ulrich, O.
     Thomas, S. Labat, C. Motz, and G. Dehm
     Acta Mater. 60 (3) 1252-1258 (2012)
218. [3.8] (5) In situ study of self-assembled GaN nanowires nucleation on Si(111) by plasma-assisted molecular beam epitaxy
     K. Hestroffer, C. Leclere, V. Cantelli, C. Bougerol, H. Renevier and B. Daudin
     Appl. Phys. Lett. 100 (21) 212107 (2012)
219. [3.6] (4) Interface-driven phase separation in multifunctional materials: The case of the ferromagnetic semiconductor GeMn
     E. Arras, F. Lançon, I. Slipukhina, É. Prestat, M. Rovezzi, S. Tardif, A. Titov, P. Bayle-Guillemaud, F. d’Acapito, A. Barski, V. Favre-Nicolin, M. Jamet, J. Cibert, and P. Pochet
     Phys. Rev. B 85, 115204 (2012)
220. [3.6] (1) Chemically ordered MnPt ultrathin films on Pt(001) substrate: Growth, atomic structure, and magnetic properties
     M. M. Soares, M. De Santis, H. C. N. Tolentino, A. Y. Ramos, M. El Jawad and Y. Gauthier
     Phys. Rev. B 85, 205417 (2012)
221. [3.6] (1) Epitaxial orientation changes in a dewetting gold film on Si(111)
     R. Daudin, T. Nogaret, T.-U. Schülli, N. Jakse, A. Pasturel and G. Renaud
     Phys. Rev. B 86, 094103 (2012)
222. [3.6] Dynamics, anisotropy, and stability of silicon-on-insulator dewetting fronts
     F. Leroy, F. Cheynis, T. Passanante, and P. Müller
     Phys. Rev. B 85, 195414 (2012) and erratum 85 239901 (2012)
223. [3.6] (2) Local deformations and incommensurability of high quality epitaxial graphene on a weakly interacting transition metal
     N. Blanc, J. Coraux, C. Vo-Van, A. T. N’Diaye, O. Geaymond, and G. Renaud
     Phys. Rev. B 86, 235439 (2012)
224. [2.4] (5) Floating lipid bilayers: Models for physics and biology
     Fragneto G., Charitat T., and Daillant J.
     European Biophysics Journal 41, 863-874 (2012)
225. [2.2] (1) Measurement of bonding energy in an anhydrous nitrogen atmosphere and its application to silicon direct bonding technology
     F. Fournel, L. Contini, C. Morales, J. Da Fonseca, H. Moriceau, F. Rieutord, A. Barthelemy and I. Radu
     J. Appl. Phys. 111 (10) 104907 (2012)
226. [2.2] (8) Structural and optical analyses of GaP/Si and (GaAsPN/GaPN)/GaP/Si nanolayers for integrated photonics on silicon
     T. Nguyen Thanh, C. Robert, W. Guo, A. Letoublon, C. Cornet, G. Elias, A. Ponchet, T. Rohel, N. Bertru, A. Balocchi, O. Durand, J.-S. Micha, M. Perrin, S. Loualiche, X. Marie and A. Le Corre
     J. Appl. Phys. 112, 053521 (2012) and Publisher erratum: J. Appl. Phys. 112, 079904 (2012)
227. [2.2] Low temperature direct bonding mechanisms of tetraethyl orthosilicate based silicon oxide films deposited by plasma enhanced chemical vapor deposition
     C. Sabbione, L. Di Cioccio, L. Vandroux, J.-P. Nieto, and F. Rieutord
     J. Appl. Phys. 112, 063501 (2012)
228. [1.7] (2) Advances in martensitic transformations in Cu-based shape memory alloys achieved by in situ neutron and synchrotron X-ray diffraction methods
     B. Malard, P. Sittner, S. Berveiller, E. Patoor
     Compt. Rend. Physique 13 (2012) 280–292
229. [1.5] Investigation of reversible plasticity in a micron-sized, single crystalline copper bending beam by X-ray μLaue diffraction
     C. Kirchlechner, W. Grosinger, M.W. Kapp, P.J. Imrich, J.-S. Micha, O. Ulrich, J. Keckes, G. Dehm and C. Motz
     Philosophical Magazine 92 (25-27), 3231-3242 (2012)
230. [1.4] (4) Growth and dewetting of gold on Si(1 1 1) investigated in situ by grazing incidence small angle x-ray scattering
     R. Daudin, C. Revenant, G. Davi and G. Renaud
     Physica E 44, 1905 (2012)
231. [1.2] Low temperature direct bonding: an attractive technique for heterostructures build-up
     H. Moriceau, F. Rieutord, F. Fournel, C. Moulet, L. Libralesso, P. Gueguen, R. Taibi and C. Deguet
     Microelectronics Reliability 52 (2) p 331-341 (2012)
232. [1.2] Regular arrays of palladium and palladium-gold clusters supported on ultrathin alumina films: stability under oxygen
     G. Sitja, M. Marsault, F. Leroy et al.
     Int. J. Nanotech. 9 (3-7) 567-575 (2012)
233. [1.1] (3) Si exfoliation by MeV proton implantation
     C. Braley, F. Mazen, A. Tauzin, F. Rieutord, C. Deguet and E. Ntsoenzok
     Nucl. Instr. Methods B 277, 93-97 (2012)
234. [1.1] (1) Smart CutTM: review on an attractive process for innovative substrate elaboration
     H. Moriceau, F. Mazen, C. Braley, F. Rieutord, A. Tauzin, and C. Deguet,
     Nucl. Instrum. Meth. B 277, p 84-92 (2012)
235. Strain and dislocation gradients from diffraction : Spatially-resolved local structure and defects Robach, O., Kirchlechner, C., Micha, J.-S., Ulrich, O., Biquard, X., Geaymond, O., Castelnau, O., Bornert, M., Petit, J., Berveiller, S., Sicardy, O., Villanova, J., and Rieutord, F.
     Chapter 5 in "Strain and dislocation gradients from diffraction" (2012) Imperial College Press and World Scientific Publishing.
     R. I. Barabash and G. E. Ice editors

2013

236. [3.6] Local band bending and grain-to-grain interaction induced strain nonuniformity in polycrystalline CdTe films
     V. Consonni, N. Baier, O. Robach, C. Cayron, F. Donatini and G. Feuillet
     accepted in Phys Rev. B
237. Energetic Structure of μLaue Peaks from a Plastically-Deformed Cu Cantilever Revealed by a Three-
     Dimensional X-ray Detector
     A. Abboud, C. Kirchlechner, J.-S. Micha, O. Ulrich, S. Send, N. Pashniak, R. Hartmann, L. Struder, J.
     Keckes and U. Pietsch
     submitted to J. Appl. Cryst
238. [30.6] A tunable multicolour 'rainbow' filter for improved stress and dislocation density field mapping in polycrystals using X-ray Laue microdiffraction
     O. Robach, J.-S. Micha, O. Ulrich, O. Geaymond, O. sicardy, L. Haertwig, F. Rieutord
     Acta Cryst A 69, 164-170 (2013)
239. [7.4] Point defect-induced strains in epitaxial graphene
     N. Blanc, F. Jean, A. V. Krasheninnikov, G. Renaud, and J. Coraux
     Phys. Rev. Lett., 111, 085501 (2013)
240. [4.5] Integration techniques for SXRD data obtained with a 2D detector
     J. Drnec, T. Zhou, S. Pintea, W. Onderwaater, E. Vlieg, G. Renaud and R. Felici,
     J. appl. Cryst., In press. (2013)
241. [4.1] Operando atomic structure and active sites of TiO2(110)-supported gold nanoparticles during carbon monoxide oxidation
     M.C. Saint-Lager, I. Laoufi and A. Bailly
     Faraday Discussions 162, 179-190 (2013)
242. [3.8] In-situ observation of stress-induced stochastic twin boundary motion in off stoichiometric NiMnGa single crystals
     R.I. Barabash, C. Kirchlechner, O. Robach, Odile; O. Ulrich, J.-S. Micha, A. Sozinov and O.M.Barabash
     Appl. Phys. Lett. 103 (2), 021909 (2013)
243. [3.8] Interface Accommodation Mechanism for Weakly Interacting Epitaxial Systems
     A. Danescu, B. Gobaut, J. Penuelas, G. Grenet, V. Favre-Nicolin, N. Blanc, T. Zhou, G. Renaud, and G. Saint-Girons
     Appl. Phys. Lett. 103, 021602 (2013)
244. [3.8] Effect of H-implantation in the local elastic properties of silicon crystals
     S. Reboh, F. Rieutord, L. Vignoud, F. Mazen, D. Landru, M. Zussy, and C. Deguet
     Appl. Phys. Lett. 103, 181911 (2013)
245. [3.8] Agglomeration dynamics of germanium islands on a silicon oxide substrate: A grazing incidence small-angle x-ray scattering study
     F. Cheynis, F. Leroy, T. Passanante et al.
     Appl. Phys. Lett. 102 (16), 161603 (2013)
246. [3.6] Robust perpendicular exchange coupling in an ultrathin CoO/PtFe double layer: Strain and spin orientation
     A. D. Lamirand, M. M. Soares, A.Y. Ramos, H.C.N. Tolentino, M. De Santis, J. C. Cezar, A. de
     Siervo and M. Jamet
     Phys. Rev. B 88, 140401 (2013)
247. [3.6] Different commensurabilities and 10-1300 K thermal expansion of graphene on Ir(111) as a function of preparation
     F. Jean, T. Zhou, N. Blanc, J. Coraux and G. Renaud,
     Phys. Rev. B 88, 165406 (2013
248. [2.6] Treatments of deposited SiOx surfaces enabling low temperature direct bonding
     C. Rauer, H. Moriceau, F. Fournel, A.-M. Charvet, C. Morales, N. Rochat, L. Vandroux, F. Rieutord, T. Mc Cormick, and I. Radu
     J. Electrochem. Soc., (2013)
249. [2.5] Metal organic vapour-phase epitaxy growth of GaN wires on Si (111) for light-emitting diode applications
     D. Salomon, A. Dussaigne, M. Lafossas, C. Durand, C. Bougerol, P. and J. Eymery
     Nanoscale Res. Lett. 8, 61-1 (2013)
250. [2.2] Lattice strain of hydrogen-implanted silicon : correlation between X-ray scattering analysis and ab-initio simulations
     F. Rieutord, F. Mazen, S. Reboh, J. D. Penot, L. Bilteanu, J. P. Crocombette, V. Vales, V. Holy, and L. Capello
     J. Appl. Phys. 113, 153511, (2013)
251. [2.2] Nanoscale organization by elastic interactions between H and He platelets in Si
     S. Reboh, F. Rieutord, F. Mazen, N. Cherkashin, M. F. Beaufort, J.-F. Barbot, M. Vallet, P. F. P. Fichtner, and J. Grilhé
     J. Appl. Phys. 114, 073517 (2013)
252. [2.2] Development of microcracks in hydrogen-implanted silicon substrates
     J. D. Penot, D. Massy, F. Rieutord, F. Mazen, S. Reboh, F. Madeira, L. Capello, D. Landru, and O. Kononchuk
     J. Appl. Phys. 114, 123513, (2013)
253. [2.0] Mechanism of Edge Bonding Void Formation in Hydrophilic Direct Wafer Bonding
     A. Castex, B. M., F. Rieutord, K. Landry, and C. Lagahe-Blanchard
     Electrochem. Sol. State Lett. 2, 47-50, (2013)
254. [1.6] Quantitative study of microtwins in GaP/Si thin film and GaAsPN quantum wells grown on silicon substrates
     T. Nguyen Thanh, C. Robert, E. Giudicelli, A. Létoublon, C. Cornet, A. Ponchet, T. Rohel, A. Balocchi, J.S. Micha, M. Perrin, S. Loualiche, X. Marie, N. Bertru, O. Durand, A. Le Corre
     J. Crystal Growth 378, 25-28 (2013)
255. [1.3] Structural investigation of nanoporous alumina film with grazing incidence small angle X-ray scattering
     D. Buttard, T. Schülli and R. Lazzari
     Phys. Stat. Solid. A 210, 2521-2525 (2013)
256. [1.1] Thermal bump removal of a Crystal Monochromator by designing an optimal shape
     J.-S. Micha, O. Geaymond, F. Rieutord
     4th international workshop on Metrology for X-ray Optics, Mirror Design, and Fabrication
     Barcelona, 4th to 6th July 2012
     Nucl. Instr. Methods A 710, 155-160 (2013)
257. [0.9] Hydrophobic direct bonding of silicon reconstructed surfaces
     C. Rauer, F. Rieutord, J. M. Hartmann, A.-M. Charvet, F. Fournel, D. Mariolle, C. Morales, and H. Moriceau
     Microsystem Technologies, 19, 675 (2013)
258. Nanostructures observed by surface sensitive x-ray scattering and highly focused beams
     T. Schulli, V. Favre-Nicolin M.-I. Richard and G. Renaud,
     Chapter in „Characterization of Semiconductor Heterostructures and Nanostructures“, C. Lamberti
     ed.; second edition, 2013, pp 113-173., Elsevier.
259. Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures
     H. Renevier and M.G. Proietti
     Chapter in: "Characterization of Semiconductor Heterostructures and Nanostructures. 2. Edition",
     Lamberti C. (Eds.)Agostini G. (Eds.) (Elsevier, 2013) pp.311-359
260. Propriétés structurales de surfaces, interfaces et nanostructures étudiées à l’aide des rayons X
     G. Renaud,
     Reflets de la Physique n°34-35 et Le BUP, Hors Série N°1 , pp 65-69, 2013

2014