| Dates: |
24-25 May, 2004 |
| Venue: |
ILL Chadwick Amphitheatre, Grenoble, France
|
| Local organising committee: |
Jürgen Härtwig
Myriam Dhez
Joanna Hoszowska
Christian Morawe
John Morse
Pierre van Vaerenbergh
|
| International advisory committee: |
Simon H. Connell (University of the Witwatersrand, South Africa)
Andreas Freund (ESRF, France)
Tetsuya Ishikawa (SPring8, Japan) |
|
Scope of the workshop
This workshop is intended to bring together a limited number (20-30) of specialists
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who grow diamond crystal and carry out the post-growth processing,
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who use diamond crystals (or intended to use them) in 3rd and 4th generation X-ray sources, mainly for X-ray optical elements (monochromators/beam splitter, filters, phase plates/polarisers), but also for electronical applications (detectors, beam-position monitors),
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who may characterise them with respect to their perfection and their degree of coherence preservation.
Goal of the workshop
The goal of the workshop is to define
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the quantitative and qualitative needs of the 3rd and 4th generation X-ray sources in diamond samples (quantity, dimensions, necessary and tolerable crystal quality (defect structure), including surface quality, for the different applications,
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the status quo and the future trends in the development of the diamond growth technologies to produce crystals that meet the needs of the 3rd and 4th generation X-ray sources,
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the contributions which may be provided by the X-ray sources and experimental techniques installed there, to characterise diamond samples to promote the improvement of the crystal growth technologies according to the needs of the 3rd and 4th generation X-ray sources,
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the possibilities and the way how the industry might satisfy the future needs in high quality synthetic diamond samples of different dimension.