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- Diffraction Contrast Tomography (DCT)
DCT is a near-field diffraction-based imaging technique that provides high-resolution grain maps of polycrystalline materials (Ludwig et al. 2008). For each individual grain, the technique can provide orientation and average elastic strain tensor components with an accuracy of a few times 10-4 (Reischig et al. 2013). The technique combines the concepts of image reconstruction from projections (tomography) and X-ray diffraction imaging (topography).
Schematic diagram showing the principles behind the DCT technique. Please click here for a fuller technical description.
For successful DCT data acquisition a number or sample conditions must be respected:
|
Parameter |
Practical limits |
Typical range |
|
Effective pixel size (microns) |
0.3-50 |
1-10 |
|
Grain size (microns) |
10-5000 |
20-200 |
|
Sample diameter (mm) |
0.05-10 |
20-200 |
|
Rotation axis-detector distance (mm) |
0.5-100 |
3-10 |
|
No. of pixels in sensor |
1024x1024 to 4096x4096 |
2048x2048 |
|
Rotational increment (o) |
0.01-1 |
0.05-0.5 |
|
Width of 2theta range (o) |
5-45 |
10-30 |
|
Accessible 2theta range (o) |
0-180 |
10-30 |
|
Accessible energy range (keV) |
6-100 |
15-50 |
The DCT "grain tracking" code is written in Matlab with some parts optimized for fast calculation implemented in "c". It is a complete package, capable of generating DCT maps from raw diffraction data but does require the user to have a basic knowledge of Matlab to run it. The complexity of the data reduction (and therefore of the degree of user 'involvement') is very much dependant of the condition of the sample, and it adhering to the specifications layed out above. A link to the DCT analysis code can be found here).
Image of High-resolution DCT grain map of a UO2 sample containing 119 grains (from Reischig et al. 2013). Please click here for a fuller experimental description.
Ludwig,W., Schmidt, S., Lauridsen, E.M. and Poulsen,H.F. (2008). X-ray diffraction contrast tomography: A novel technique for three-dimensional grainmap ping of polycrystals. 1. Direct beam case, J. Appl. Crystallogr., 41, 302–309.
P. Reischig, A. King, L. Nervo, N. Vigano, Y. Guilhem, W. J. Palenstijn, K. J. Batenburg, M. Preuss & W. Ludwig. Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials. Journal of Applied Crystallography 46, 297--311 (2013).