Metal–ferroelectric supercrystals with periodically curved metallic layers
Hadjimichael M., Li Y., Zatterin E., Chahine G.A., Conroy M., Moore K., O'Connell E.N., Ondrejkovic P., Marton P., Hlinka J., Bangert U., Leake S., Zubko P.,
Nature Materials , epub (2021)
Spatially-resolved luminescence and crystal structure of single core-shell nanowires measured in the as-grown geometry
AlHassan A., Lahnemann J., Leake S., Küpers H., Niehle M., Bahrami D., Bertram F., Lewis R.B., Davtyan A., Schülli T.U., Geelhaar L., Pietsch U.,
Nanotechnology 31, 214002-1-214002-7 (2020)
Evidence of charge density wave transverse pinning by x-ray microdiffraction
Bellec E., Gonzalez-Vallejo I., Jacques V.L.R., Sinchenko A.A., Orlov A.P., Monceau P., Leake S.J., Le Bolloc'h D.,
Physical Review B 101, 125122-1-125122-5 (2020)
The essential role of surface pinning in the dynamics of charge density waves submitted to external dc fields
Bellec E., Jacques V.L.R., Caillaux J., Le Bolloc'h D.,
European Physical Journal B 93, 165-1-165-14 (2020)
Complete strain mapping of nanosheets of tantalum disulfide
Cao Y., Assefa T., Banerjee S., Wieteska A., Wang D.Z.R., Pasupathy A., Tong X., Liu Y., Lu W.J., Sun Y.P., He Y., Huang X.J., Yan H.F., Chu Y.S., Billinge S.J.L., Robinson I.K.,
ACS Applied Materials & Interfaces 12, 43173-43179 (2020)
Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
Chen C.G., Zhou T., Danilov D.L., Gao L., Benning S., Schön N., Tardif S., Simons H., Hausen F., Schülli T.U., Eichel R.A., Notten P.H.L.,
Nature Communications 11, 3283-1-3283-10 (2020)
X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires
Davtyan A., Kriegner D., Holý V., AlHassan A., Lewis R.B., McDermott S., Geelhaar L., Bahrami D., Anjum T., Ren Z., Richter C., Novikov D., Müller J., Butz B., Pietsch U.,
Journal of Applied Crystallography 53, 1310-1320 (2020)
Real- and Q-space travelling: Multi-dimensional distribution maps of crystal-lattice strain (ε044) and tilt of suspended monolithic silicon nanowire structures
Dolabella S., Frison R., Chahine G.A., Richter C., Schülli T.U., Tasdemir Z., Alaca B.E., Leblebici Y., Dommann A., Neels A.,
Journal of Applied Crystallography 53, 58-68 (2020)
Bragg coherent imaging of nanoprecipitates: Role of superstructure reflections
Dupraz M., Leake S.J., Richard M.I.,
Journal of Applied Crystallography 53, 1353-1369 (2020)
Resonant nanodiffraction X-ray imaging reveals role of magnetic domains in complex oxide spin caloritronics
Evans P.G., Marks S.D., Geprägs S., Dietlein M., Joly Y., Dai M., Hu J., Bouchenoire L., Thompson P.B.J., Schülli T.U., Richard M., Gross R., Carbone D., Mannix D.,
Science Advances 6, eaba9351-1-eaba9351-8 (2020)
PyNX: High-performance computing toolkit for coherent X-ray imaging based on operators
Favre-Nicolin V., Girard G., Leake S., Carnis J., Chushkin Y., Kieffer J., Paleo P., Richard M.I.,
Journal of Applied Crystallography 53, 1404-1413 (2020)
Multi-wavelength Bragg coherent X-ray diffraction imaging of Au particles
Lauraux F., Cornelius T.W., Labat S., Richard M.I., Leake S.J., Zhou T., Kovalenko O., Rabkin E., Schülli T.U., Thomas O.,
Journal of Applied Crystallography 53, 170-177 (2020)
Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO3 thin films
Lee H.J., Kim J., Hwang S.H., Choe H., Gorfman S., Heo Y.J., Lee S.Y., Janolin P.E., Kornev I., Schülli T.U., Richter C., Lee J.H., Pietsch U., Yang C.H., Jo J.Y.,
APL Materials 8, 101110-1-101110-7 (2020)
Mapping inversion domain boundaries along single GaN wires with bragg coherent x-ray imaging
Li N., Labat S., Leake S.J., Dupraz M., Carnis J., Cornelius T.W., Beutier G., Verdier M., Favre-Nicolin V., Schülli T.U., Thomas O., Eymery J., Richard M.I.,
ACS Nano 14, 10305-10312 (2020)
X-ray coherent diffraction imaging with an objective lens: Towards three-dimensional mapping of thick polycrystals
Pedersen A.F., Chamard V., Detlefs C., Zhou T., Carbone D., Poulsen H.F.,
Physical Review Research 2, 033031-1-033031-13 (2020)
Hard X-ray imaging at ESRF: Exploiting contrast and coherence with the new EBS storage ring
Rack A.,
Synchrotron Radiation News 33, 20-28 (2020)
Variable‐wavelength quick scanning nanofocused X‐ray microscopy for in situ strain and tilt mapping
Richard M., Cornelius T.W., Lauraux F., Molin J., Kirchlechner C., Leake S.J., Carnis J., Schülli T.U., Thilly L., Thomas O.,
Small 16, 1905990-1-1905990-7 (2020)
Coherent X-ray imaging of CO-adsorption-induced structural changes in Pt nanoparticles: Implications for catalysis
Abuín M., Kim Y.Y., Runge H., Kulkarni S., Maier S., Dzhigaev D., Lazarev S., Gelisio L., Seitz C., Richard M.I., Zhou T., Vonk V., Keller T.F., Vartanyants I.A., Stierle A.,
ACS Applied Nano Materials 2, 4818-4824 (2019)
Nanosecond optically induced phase transformation in compressively strained BiFeO3 on LaAlO3
Ahn Y., Pateras A., Marks S.D., Xu H., Zhou T., Luo Z., Chen Z., Chen L., Zhang X., DiChiara A.D., Wen H., Evans P.G.,
Physical Review Letters 123, 045703-1-045703-6 (2019)
Study of charge density wave materials under current by X-ray diffraction
Bellec E.
From: Université Paris-Sud, France (PhD Thesis),
2019
Towards a quantitative determination of strain in Bragg coherent X-ray diffraction imaging: Artefacts and sign convention in reconstructions
Carnis J., Gao L., Labat S., Kim Y.Y., Hofmann J.P., Leake S.J., Schülli T.U., Hensen E.J.M., Thomas O., Richard M.I.,
Scientific Reports 9, 17357-1-17357-13 (2019)
Interfacial aspects involved in the operation of Si-based lithium-ion microbatteries
Chen C.
From: Technische Universiteit Eindhoven, The Netherlands (PhD Thesis),
2019
Epitaxial and lateral solid-phase crystallization of complex oxides
Chen Y.
From: University of Wisconsin- Madison, USA (PhD Thesis),
2019
Seeded lateral solid-phase crystallization of the perovskite oxide SrTiO3
Chen Y., Tilka J.A., Ahn Y., Park J., Pateras A., Zhou T., Savage D.E., McNulty I., Holt M.V., Paskiewicz D.M., Fong D.D., Kuech T.F., Evans P.G.,
Journal of Physical Chemistry C 123, 7447-7456 (2019)
In situ structural evolution of single particle model catalysts under ambient pressure reaction conditions
Fernández S., Gao L., Hofmann J.P., Carnis J., Labat S., Chahine G.A., van Hoof A.J.F., Verhoeven M.W.G.M., Schülli T.U., Hensen E.J.M., Thomas O., Richard M.I.,
Nanoscale 11, 331-338 (2019)
In depth characterization of Ge-Si core-shell nanowires using X-ray coherent diffraction and time resolved pump-probe spectroscopy
Fernández S., Jean C., Charron E., Gentile P., Richard M.I., Thomas O., Perrin B., Belliard L.,
Journal of Applied Physics 126, 204304-1-204304-7 (2019)
Measurement of local strain
Gammer C., Richard M.I., Eberl C.,
MRS Bulletin 44, 459-464 (2019)
Structural insights into the formation and voltage degradation of lithium- and manganese-rich layered oxides
Hua W., Wang S., Knapp M., Leake S.J., Senyshyn A., Richter C., Yavuz M., Binder J.R., Grey C.P., Ehrenberg H., Indris S., Schwarz B.,
Nature Communications 10, 5365-1-5365-11 (2019)
Entwicklung einer Röntgenzoomlinse
Kornemann E.
From: Karlsruher Institut für Technologie, Germany (PhD Thesis),
2018
X-ray zoom lens allows for energy scans in X-ray microscopy
Kornemann E., Zhou T., Márkus O., Opolka A., Schülli T.U., Mohr J., Last A.,
Optics Express 27, 185-195 (2019)
Ferroelectric self-poling in GeTe films and crystals
Kriegner D., Springholz G., Richter C., Pilet N., Müller E., Capron M., Berger H., Holý V., Dil J.H., Krempaský J.,
Crystals 9, 335-1-335-15 (2019)
The Nanodiffraction beamline ID01/ESRF: A microscope for imaging strain and structure
Leake S.J., Chahine G.A., Djazouli H., Zhou T., Richter C., Hilhorst J., Petit L., Richard M.I., Morawe C., Barrett R., Zhang L., Homs-Regojo R.A., Favre-Nicolin V., Boesecke P., Schülli T.U.,
Journal of Synchrotron Radiation 26, 571-584 (2019)
Modified strain and elastic energy behavior of Ge islands formed on high-miscut Si(0 0 1) substrates
Marçal L.A.B., Richard M.I., Persichetti L., Favre-Nicolin V., Renevier H., Fanfoni M., Sgarlata A., Schülli T.U., Malachias A.,
Applied Surface Science 466, 801-807 (2019)
Coupling of coherent misfit strain and composition distributions in core–shell Ge/Ge1-xSnx nanowire light emitters
Meng A.C., Braun M.R., Wang Y., Fenrich C.S., Xue M., Diercks D.R., Gorman B.P., Richard M.I., Marshall A.F., Cai W., Harris J.S., McIntyre P.C.,
Materials Today Nano 5, 100026-1-100026-11 (2019)
Multilayer based x-ray optics at the ESRF
Morawe C.,
AIP Conference Proceedings 2054, 060002-1-060002-10 (2019)
Microwave-green synthesis of AlPO-n and SAPO-n (n = 5 and 18) nanosized crystals and their assembly in layers
Ng E., Awala H., Komaty S., Mintova S.,
Microporous and Mesoporous Materials 280, 256-263 (2019)
Advanced coherent X-ray diffraction and electron microscopy of individual InP nanocrystals on Si nanotips for III-V-on-Si electronics and optoelectronics
Niu G., Leake S.J., Skibitzki O., Niermann T., Carnis J., Kiessling F., Hatami F., Hussein E.H., Schubert M.A., Zaumseil P., Capellini G., Masselink W.T., Ren W., Ye Z.G., Lehmann M., Schülli T., Schroeder T., Richards M.I.,
Physical Review Applied 11, 064046-1-064046-9 (2019)
Electrode-induced lattice distortions in GaAs multi-quantum-dot arrays
Pateras A., Carnis J., Mukhopadhyay U., Richard M.I., Leake S. J., Schülli T.U., Reichl C., Wegscheider W., Dehollain J.P., Vandersypen L.M.K., Evans P.G.,
Journal of Materials Research 34, 1291-1301 (2019)
2. X-ray structure analysis of lipid membrane systems: Solid-supported bilayers, bilayer stacks, and vesicles
Salditt T., Komorowski K., Frank K.,
In: "Characterization of Biological - Membranes Structure and Dynamics" Nieh M.P. (Eds.) Heberle F.A. (Eds.) Katsaras J. (Eds.) (De Gruyter GmbH, 2019) pp. 43-86
Local order in Cr-Fe-Co-Ni: Experiment and electronic structure calculations
Schönfeld B., Sax C.R., Zemp J., Engelke M., Boesecke P., Kresse T., Boll T., Al-Kassab T., Peil O.E., Ruban A.V.,
Physical Review B 99, 014206-1-014206-18 (2019)
Controlling dislocation nucleation-mediated plasticity in nanostructures via surface modification
Shin J., Chen L.Y., Sanli U.T., Richter G., Labat S., Richard M.I., Cornelius T., Thomas O., Gianola D.S.,
Acta Materialia 166, 572-586 (2019)
Transition metal chalcogenide based functional materials for renewable energy conversion
Wu L.
From: Technische Universiteit Eindhoven, The Netherlands (PhD Thesis),
2019
Enhancing the electrocatalytic activity of 2H-WS2 for hydrogen evolution via defect engineering
Wu L., van Hoof A.J.F., Dzade N.Y., Gao L., Richard M.I., Friedrich H., de Leeuw N.H., Hensen E.J.M., Hofmann J.P.,
Physical Chemistry Chemical Physics 21, 6071-6079 (2019)
A study of the strain distribution by scanning X-ray diffraction on GaP/Si for III-V monolithic integration on silicon
Zhou A., Wang Y.P., Cornet C., Léger Y., Pédesseau L., Favre-Nicolin V., Chahine G.A., Schülli T.U., Eymery J., Bahri M., Largeau L., Patriarche G., Durand O., Létoublon A.,
Journal of Applied Crystallography 52, 809-815 (2019)
Correlation of optical, structural, and compositional properties with V-pit distribution in InGaN/GaN multiquantum wells
Zoellner M.H., Chahine G.A., Lahourcade L., Mounir C., Manganelli C.L., Schülli T.U., Schwarz U.T., Zeisel R., Schroeder T.,
ACS Applied Materials & Interfaces 11, 22834-22839 (2019)
Complete structural and strain analysis of single GaAs/(In,Ga)As/GaAs core–shell–shell nanowires by means of in-plane and out-of-plane X-ray nanodiffraction
Al Hassan A., Davtyan A., Küpers H., Lewis R.B., Bahrami D., Bertram F., Bussone G., Richter C., Geelhaar L., Pietsch U.,
Journal of Applied Crystallography 51, 1387-1395 (2018)
Pérovskites halogénées AMX3 : synthèse, substitution cationique et étude structurale
Bouchard M.
From: Université Grenoble Alpes, France (PhD Thesis),
2018
Coherent X-ray diffraction imaging meets ptychography to study core-shell-shell nanowires
Davtyan A., Favre-Nicolin V., Lewis R.B., Küpers H., Geelhaar L., Kriegner D., Bahrami D., Al-Hassan A., Chahine G., Loffeld O., Pietsch U.,
MRS Advances 3, 2317-2322 (2018)
In situ coherent x-ray diffraction during three-point bending of a Au nanowire: Visualization and quantification
Davydok A., Cornelius T.W., Ren Z., Leclere C., Chahine G., Schülli T., Lauraux F., Richter G., Thomas O.,
Quantum Beam Science 2, 24-1-24-9 (2018)
Strain distribution induced in SOI photonic substrate by through silicon via using advanced scanning X-ray nano-diffraction
Escoubas S., Vianne B., Richard M.I., Farcy A., Fiori V., Thomas O.,
IEEE Transactions on Device and Materials Reliability 18, 529-533 (2018)
Amélioration de l'incorporation d'indium dans zone active à base d'InGaN grâce à la croissance sur pseudo-substrat InGaN pour l'application à la DEL blanche monolithique (In incorporation improvement in InGaN based active region using InGaN pseudo substrate for monolithic white LED application)
Even A.
From: Université Grenoble Alpes, France (PhD Thesis),
2018
Domain wall orientations in ferroelectric superlattices probed with synchrotron X-ray diffraction
Hadjimichael M., Zatterin E., Fernandez-Peña S., Leake S.J., Zubko P.,
Physical Review Letters 120, 037602-1-037602-6 (2018)
SiGe/Si epitaxy and wafer bonding applied to X-ray detectors
Jung A.S.
From: ETH Zürich, Switzerland (PhD Thesis),
2018
Three-dimensional imaging of phase ordering in an Fe-Al alloy by Bragg ptychography
Kim C., Chamard V., Hallmann J., Roth T., Lu W., Boesenberg U., Zozulya A., Leake S., Madsen A.,
Physical Review Letters 121, 256101-1-256101-6 (2018)
Microscopy and nanoscopy of organic semiconductors for structural and electronic analysis
Liewald C.
From: Ludwig-Maximilians-Universität, München, Germany (PhD Thesis),
2018
Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals
Meduna M., Isa F., Jung A., Marzegalli A., Albani M., Isella G., Zweiacker K., Miglio L., von Känel H.,
Journal of Applied Crystallography 51, 368-385 (2018)
Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging
Richard M.I., Fernández S., Eymery J., Hofmann J.P., Gao L., Carnis J., Labat S., Favre-Nicolin V., Hensen E.J.M., Thomas O., Schülli T.U., Leake S.J.,
Nanoscale 10, 4833-4840 (2018)
Misfit-dislocation distributions in heteroepitaxy: From mesoscale measurements to individual defects and back
Rovaris F., Zoellner M.H., Zaumseil P., Schubert M.A., Marzegalli A., Di Gaspare L., De Seta M., Schroeder T., Storck P., Schwalb G., Richter C., Schülli T.U., Capellini G., Montalenti F.,
Physical Review Applied 10, 054067-1-054067- (2018)
Plastic deformation of InSb micro-pillars: A comparative study between spatially resolved Laue and monochromatic X-ray micro-diffraction maps
Sadat T., Verezhak M., Godard P., Renault P.O., Van Petegem S., Jacques V., Diaz A., Grolimund D., Thilly L.,
Materials Research Proceedings 6, 21-26 (2018)
In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire
Shin J., Cornelius T.W., Labat S., Lauraux F., Richard M.I., Richter G., Blanchard N.P., Gianola D.S., Thomas O.,
Journal of Applied Crystallography 51, 781-788 (2018)
Coherent hard X-ray multiprojection imaging
Villanueva-Perez P., Pedrini B., Mokso R., Vagovic P., Guzenko V., Leake S., Willmott P.R., David C., Chapman H.N., Stampanoni M.,
Microscopy and Microanalysis 24, 50-51 (2018)
Hard x-ray multi-projection imaging for single-shot approaches
Villanueva-Perez P., Pedrini B., Mokso R., Vagovic P., Guzenko V.A., Leake S.J., Willmott P.R., Oberta P., David C., Chapman H.N., Stampanoni M.,
Optica 5, 1521-1-1521-4 (2018)
Faceting of local droplet-etched nanoholes in AlGaAs
Vonk V., Slobodskyy T., Keller T.F., Richard M.I., Fernández S., Schülli T., Heyn C., Hansen W., Stierle A.,
Physical Review Materials 2, 106001-106001-8 (2018)
Reconstitution of SNARE proteins into solid-supported lipid bilayer stacks and X-ray structure analysis
Xu Y., Kuhlmann J., Brennich M., Komorowski K., Jahn R., Steinem C., Salditt T.,
Biochimica et Biophysica Acta (BBA) - Biomembranes 1860, 566-578 (2018)
Lattice tilt mapping using full field diffraction X-ray microscopy at ID01 ESRF
Zhou T., Stankevic T., Troian A., Ren Z., Bi Z., Ohlsson J., Samuelson L., Hilhorst J., Schülli T., Mikkelsen A., Balmes O.,
Microscopy and Microanalysis 24, 126-127 (2018)
Direct evidence of chlorine-induced preferential crystalline orientation in methylammonium lead iodide perovskites grown on TiO2
Bouchard M., Hilhorst J., Pouget S., Alam F., Mendez M., Djurado D., Aldakov D., Schülli T., Reiss P.,
Journal of Physical Chemistry C 121, 7596-7602 (2017)
Etude de la déformation locale de films minces de verres métalliques par nano-diffraction de rayons X synchrotron
Daudin R., Coulombier M., Schülli T., Zhou T., Idrissi H., Raskin J.P., Pardoen T.,
, ()
Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging
Davtyan A., Krause T., Kriegner D., Al-Hassan A., Bahrami D., Mostafavi Kashani S.M., Lewis R.B., Küpers H., Tahraoui A., Geelhaar L., Hanke M., Leake S.J., Loffeld O., Pietsch U.,
Journal of Applied Crystallography 50, 673-680 (2017)
Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction
Davtyan A., Lehmann S., Kriegner D., Zamani R.R., Dick K.A., Bahrami D., Al-Hassan A., Leake S.J., Pietsch U., Holý V.,
Journal of Synchrotron Radiation 24, 981-990 (2017)
3D imaging of a dislocation loop at the onset of plasticity in an indented nanocrystal
Dupraz M., Beutier G., Cornelius T.W., Parry G., Ren Z., Labat S., Richard M.I., Chahine G.A., Kovalenko O., de Boissieu M., Rabkin E., Verdier M., Thomas O.,
Nano Letters 17, 6696-6701 (2017)
Non destructive analysis of grain sub-structuration in single grains of an Aluminium polycrystal deformed in uniaxial tension
Filippelli E.F.
From: Université de Lyon, France (PhD Thesis),
2017
Développement de la tomographie par rayons X en synchrotron pour l'industrie : application à l'analyse de défaillance en intégration 3D (Towards the industrial use of synchrotron x-ray nano-tomography for 3D integration failure analysis)
Fraczkiewicz A.
From: Université Grenoble Alpes, France (PhD Thesis),
2017
Connecting the dots : Shedding light on the self-assembly of semiconductor nanocrystals with synchrotron X-ray scattering techniques
Geuchies J.J.
From: Utrecht University, The Netherlands (PhD Thesis),
2017
Growth mechanism and surface state of CuInS2 nanocrystals synthesized with dodecanethiol
Gromova M., Lefrancois A., Vaure L., Agnese F., Aldakov D., Maurice A., Djurado D., Lebrun C., De Geyer A., Schülli T.U., Pouget S., Reiss P.,
Journal of the American Chemical Society 139, 15748-15759 (2017)
X-ray waveguide optics : Beyond straight channels
Hoffmann-Urlaub S.
From: Universitätsverlag Göttingen, Germany (PhD Thesis),
2017
Observation of individual stacking faults in GaN microcrystals by x-ray nanodiffraction
Holý V., Kriegner D., Lesnik A., Bläsing J., Wieneke M., Dadgar A., Harcuba P.,
Applied Physics Letters 110, 121905-1-121905-5 (2017)
Superlattice growth and rearrangement during evaporation-induced nanoparticle self-assembly
Josten E., Wetterskog E., Glavic A., Boesecke P., Feoktystov A., Brauweiler-Reuters E., Rücker U., Salazar-Alvarez G., Brückel T., Bergström L.,
Scientific Reports 7, 2802-1-2802-9 (2017)
Miniaturized compound refractive X-ray zoom lens
Kornemann E., Márkus O., Opolka A., Zhou T., Greving I., Storm M., Krywka C., Last A., Mohr J.,
Optics Express 25, 22455-22466 (2017)
Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction
Kriegner D., Harcuba P., Veselý J., Lesnik A., Bauer G., Springholz G., Holý V.,
Journal of Applied Crystallography 50, 369-377 (2017)
Coherent nanoscale X-ray probe for crystal interrogation at ID01, ESRF – The European Synchrotron
Leake S.J., Favre-Nicolin V., Zatterin E., Richard M.I., Fernández S., Chahine G., Zhou T., Boesecke P., Djazouli H., Schülli T.U.,
Materials and Design 119, 470-471 (2017)
In situ grazing-incidence small-angle X-ray scattering observation of block-copolymer templated formation of magnetic nanodot arrays and their magnetic properties
Meyer A., Franz N., Oepen H.P., Perlich J., Carbone G., Metzger T.H.,
Nano Research 10, 456-471 (2017)
Finite size effect on the structural and magnetic properties of MnAs/GaAs(001) patterned microstructures thin films
Mocuta C., Bonamy D., Stanescu S., El Moussaoui S., Barbier A., Montaigne F., Maccherozzi F., Bauer E., Belkhou R.,
Scientific Reports 7, 16970-1-16970-18 (2017)
Double multilayer monochromators for upgraded ESRF beamlines
Morawe C., Carau D., Peffen J.C.,
Proceedings SPIE 10386, 1038603-1-1038603-6 (2017)
Reactor for nano-focused x-ray diffraction and imaging under catalytic in situ conditions
Richard M.I., Fernández S., Hofmann J.P., Gao L., Chahine G.A., Leake S.J., Djazouli H., De Bortoli Y., Petit L., Boesecke P., Labat S., Hensen E.J.M., Thomas O., Schülli T.,
Review of Scientific Instruments 88, 093902-1-093902-5 (2017)
Scanning X-ray nanodiffraction from ferroelectric domains in strained K0.75Na0.25NbO3 epitaxial films grown on (110) TbScO3
Schmidbauer M., Hanke M., Kwasniewski A, Braun D, von Helden L., Feldt C., Leake S.J., Schwarzkopf J.,
Journal of Applied Crystallography 50, 519-524 (2017)
Structural and thermodynamic properties of nanoparticle–protein complexes: A combined SAXS and SANS study
Spinozzi F., Ceccone G., Moretti P., Campanella G., Ferrero C., Combet S., Ojea-Jimenez I., Ghigna P.,
Langmuir 33, 2248-2256 (2017)
Combined X-ray-atomic force microscopy tools at the ESRF: The first 10 years
Costa L., Rodrigues M.S.,
Synchrotron Radiation News 29, 3-7 (2016)
Remarkable strength characteristics of defect-free SiGe/Si heterostructures obtained by Ge condensation
David T., Liu K., Fernández S., Richard M.I., Ronda A., Favre L., Abbarchi M., Benkouider A., Aqua J.N., Peters M., Voorhees P., Thomas O., Berbezier I.,
Journal of Physical Chemistry C 120, 20333-20340 (2016)
Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging
Davtyan A., Biermanns A., Loffeld O., Pietsch U.,
New Journal of Physics 18, 063021-1-063021-12 (2016)
An insight into nanostructures through coherent diffraction imaging
Fernández S.
From: Université Aix Marseille, France (PhD Thesis),
2016
Evaluation of intragranular strain and average dislocation density in single grains of a polycrystal using K-map scanning
Filippelli E., Chahine G., Borbély A.,
Journal of Applied Crystallography 49, 1814-1817 (2016)
Shape and interhelical spacing of DNA origami nanostructures studied by small-angle X-ray scattering
Fischer S., Hartl C., Frank K., Rädler J.O., Liedl T., Nickel B.,
Nano Letters 16, 4282-4287 (2016)
Asymmetric skew X-ray diffraction at fixed incidence angle: Application to semiconductor nano-objects
Grigoriev D., Lazarev S., Schroth P., Minkevich A.A., Köhl M., Slobodskyy T., Helfrich M., Schaadt D.M., Aschenbrenner T., Hommel D., Baumbach T.,
Journal of Applied Crystallography 49, 961-967 (2016)
Advances in fabrication of X-ray waveguides
Hoffmann-Urlaub S., Höhne P., Kanbach M., Salditt T.,
Microelectronic Engineering 164, 135-138 (2016)
Miniaturized beamsplitters realized by X-ray waveguides
Hoffmann-Urlaub S., Salditt T.,
Acta Crystallographica A 72, 515-522 (2016)
Strain distribution in single, suspended germanium nanowires studied using nanofocused x-rays
Keplinger M., Grifone R., Greil J., Kriegner D., Persson J., Lugstein A., Schülli T., Stangl J.,
Nanotechnology 27, 055705-1-055705-10 (2016)
Effect of dimensionality on sliding charge density waves: The quasi-two-dimensional TbTe3 system probed by coherent x-ray diffraction
Le Bolloc'h D., Sinchenko A.A., Jacques V.L.R., Ortega L., Lorenzo J.E., Chahine G.A., Lejay P., Monceau P.,
Physical Review B 93, 165124-1-165124-5 (2016)
PyNX.Ptycho: A computing library for X-ray coherent diffraction imaging of nanostructures
Mandula O., Elzo Aizarna M., Eymery J., Burghammer M., Favre-Nicolin V.,
Journal of Applied Crystallography 49, 1842-1848 (2016)
Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling
Meduna M., Falub C.V., Isa F., Marzegalli A., Chrastina D., Isella G., Miglio L., Dommann A., von Känel H.,
Journal of Applied Crystallography 49, 976-986 (2016)
Target nanoparticles for therapy - SANS and DLS of drug carrier liposomes and polymer nanoparticles
Nawroth T., Johnson R., Krebs L., Khoshakhlagh P., Langguth P., Hellmann N., Goerigk G., Boesecke P., Bravin A., Le Duc G., Székely N., Schweins R.,
Journal of Physics : Conference Series 746, 012069-1-012069-3 (2016)
Strain dynamics during La2O3/Lu2O3 superlattice and alloy formation
Proessdorf A., Niehle M., Grosse F., Rodenbach P., Hanke M., Trampert A.,
Journal of Applied Physics 119, 215301-1-215301-5 (2016)
Temperature evolution of defects and atomic ordering in Si1-xGex islands on Si(001)
Richard M.I., Malachias A., Stoffel M., Merdzhanova T., Schmidt O.G., Renaud G., Metzger T.H., Schülli T.U.,
Journal of Applied Physics 119, 085704-1-085704-10 (2016)
X-ray excited optical fluorescence and diffraction imaging of reactivity and crystallinity in a zeolite crystal: Crystallography and molecular spectroscopy in one
Ristanović Z., Hofmann J.P., Richard M.I., Jiang T., Chahine G.A., Schülli T.U., Meirer F., Weckhuysen B.M.,
Angewandte Chemie International Edition 55, 7496-7500 (2016)
Zeolite chemistry studied at the level of single particles, molecules and atoms
Ristanović Z.
From: Utrecht University, The Netherland (PhD Thesis),
2016
Heavy-atom labeled transmembrane β-peptides: Synthesis, CD-spectroscopy, and X-ray diffraction studies in model lipid multilayer
Rost U., Xu Y., Salditt T., Diederichsen U.,
ChemPhysChem 17, 2525-2534 (2016)
Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction
Schäfer N., Chahine G.A., Wilkinson A.J., Schmid T., Rissom T., Schülli T.U., Abou-Ras D.,
Journal of Applied Crystallography 49, 632-635 (2016)
Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy
Schäfer N., Wilkinson A.J., Schmid T., Winkelmann A., Chahine G.A., Schülli T.U., Rissom T., Marquardt J., Schorr S., Abou-Ras D.,
Ultramicroscopy 169, 89-97 (2016)
Theoretical analysis and experimental applications of X-ray waveguides
Bukreeva I., Pelliccia D., Cedola A., Sorrentino A., Scarinci F., Ilie M., Fratini M., Asadchikov V.E., Nosik V.L., Lagomarsino S.,
In: "Short wavelength laboratory sources: Principles and practices" Bleiner D. (Eds.) Costello J. (Eds.) Dortan F. (Eds.) O'Sullivan G. (Eds.) Pina L. (Eds.) Michette A. (Eds.) (Royal Society of Chemistry, 2015) pp. 65-84
Correlation of electrical and structural properties of single as-grown GaAs nanowires on Si (111) substrates
Bussone G., Schäfer-Eberwein H., Dimakis E., Biermanns A., Carbone D., Tahraoui A., Geelhaar L., Bolívar P.H., Schülli T.U., Pietsch U.,
Nano Letters 15, 981-989 (2015)
Strain and lattice orientation distribution in SiN/Ge complementary metal-oxide-semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy
Chahine G.A., Zoellner M.H., Richard M.I., Guha S., Reich C., Zaumseil P., Capellini G., Schroeder T., Schülli T.U.,
Applied Physics Letters 106, 071902-1-071902-4 (2015)
Synthesis of CdS nanocrystals in polymeric films studied by in-situ GID and GISAXS
Di Luccio T., Carbone D., Masala S., Ramachandran K., Kornfield J.,
MRS Proceedings 1810, 1-6 (2015)
Diffraction des rayons X cohérents appliquée à la physique du métal
Dupraz M.
From: Université Grenoble Alpes, France (PhD thesis),
2015
Interaction of Pluronic polymers with sugar surfactant in microemulsions designed for decontamination
Höhn S.
From: Universität Bielefeld, Germany (PhD Thesis),
2015
X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment
Keplinger M., Mandl B., Kriegner D., Holý V., Samuelsson L., Bauer G., Deppert K., Stangl J.,
Journal of Synchrotron Radiation 22, 59-66 (2015)
Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging
Labat S., Richard M.I., Dupraz M., Gailhanou M., Beutier G., Verdier M., Mastropietro F., Cornelius T.W., Schülli T.U., Eymery J., Thomas O.,
ACS Nano 9, 9210-9216 (2015)
Sliding state of the quasi-two dimensional CDW system TbTe3 probed by coherent x-ray diffraction
Le Bolloc'h D., Sinchenko A.A., Jacques V.L.R., Ortega L., Lorenzo E., Lejay P., Schülli T., Chahine G., Monceau P.,
Physica B 460, 96-99 (2015)
Microdiffraction imaging-a suitable tool to characterize organic electronic devices
Liewald C., Noever S., Fischer S., Roemer J., Schülli T.U., Nickel B.,
AIMS Materials Science 2, 269-278 (2015)
Changes of the molecular structure in organic thin film transistors during operation
Liscio F., Ferlauto L., Matta M., Pfattner R., Murgia M., Rovira C., Mas-Torrent M., Zerbetto F., Milita S., Biscarini F.,
Journal of Physical Chemistry C 119, 15912-15918 (2015)
Direct evidence of strain transfer for InAs island growth on compliant Si substrates
Marçal L.A.B., Richard M.I., Magalhães-Paniago R., Cavallo F., Lagally M.G., Schmidt O.G., Schülli T.U., Deneke C., Malachias A.,
Applied Physics Letters 106, 151905-1-151905-5 (2015)
Application of micro- and nanobeams for materials Science
Martínez-Criado G.,
In: "Synchrotron Light Sources and Free-Electron Lasers. Accelerator Physics, Instrumentation and Science Applications" Jaeschke E. (Eds.) Khan S. (Eds.) Schneider J.R. (Eds.) Hastings J.B. (Eds.) (Springer, 2015) pp. 1-31
Structural mapping of functional Ge layers grown on graded SiGe buffers for sub-10 nm CMOS applications using advanced X-ray nanodiffraction
Richard M.I., Zoellner M.H., Chahine G.A., Zaumseil P., Capellini G., Häberlen M., Storck P., Schülli T.U., Schroeder T.,
ACS Applied Materials & Interfaces 7, 26696-26700 (2015)
X-ray optics on a chip: Guiding X rays in curved channels
Salditt T., Hoffmann S., Vassholz M., Haber J., Osterhoff M., Hilhorst J.,
Physical Review Letters 115, 203902-1-203902-5 (2015)
Czochralski and mono-like p-type and n-type silicon solar cells: Relationship between strain and stress induced by the back contact, and photovoltaic performance
Tran Thi T.N., Dubois S., Baruchel J., Enjalbert N., Fernandez B., Schülli T., Lafford T.A.,
Solar Energy Materials and Solar Cells 135, 17-21 (2015)
Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction
Vianne B., Escoubas S., Richard M.I., Labat S., Chahine G., Schülli T., Farcy A., Bar P., Fiori V., Thomas O.,
Microelectronic Engineering 137, 117-123 (2015)
Effect of the temperature on the strain distribution induced in silicon interposer by TSVs: A comparison between micro-Laue and monochromatic nanodiffraction
Vianne B., Krauss C., Escoubas S., Richard M.I., Labaf S., Chahine G., Schülli T., Micha J.S., Fiori V., Farcy A., Thomas O.,
, ()
Through-silicon via-induced strain distribution in silicon interposer
Vianne B., Richard M.I., Escoubas S., Labat S., Schülli T., Chahine G., Fiori V., Thomas O.,
Applied Physics Letters 106, 141905-1-141905-5 (2015)
Imaging structure and composition homogeneity of 300 mm SiGe virtual substrates for advanced CMOS applications by scanning X-ray diffraction microscopy
Zoellner M.H., Richard M.I., Chahine G.A., Zaumseil P., Reich C., Capellini G., Montalenti F., Marzegalli A., Xie Y.H., Schülli T.U., Häberlen M., Storck P., Schroeder T.,
ACS Applied Materials & Interfaces 7, 9031-9037 (2015)
Long-range orientation and atomic attachment of nanocrystals in 2D honeycomb superlattices
Boneschanscher M.P., Evers W.H., Geuchies J.J., Altantzis T., Goris B., Rabouw F.T., van Rossum S.A.P., van der Zant H.S.J., Siebbeles L.D.A., Van Tendeloo G., Swart I., Hilhorst J., Petukhov A.V., Bals S., Vanmaekelbergh D.,
Science 344, 1377-1380 (2014)
Impact of strain induced by polymer curing in benzocyclobutene embedded semiconductor nanostructures
Bussone G., Dimakis E., Grifone R., Biermanns A., Tahraoui A., Carbone D., Geelhaar L., Schülli T.U., Pietsch U.,
Physica Status Solidi-Rapid Research Letters 8, 1007-1010 (2014)
Structure and electrical response of GaAs nanowires : Looking for a correlation at the nano-scale
Bussone-Grifone G.
From: Universität Siegen, Germany (PhD Thesis),
2014
Structural observation of piezoelectric inhomogeneity in a mixed-orientation Na0.5Bi0.5TiO3 perovskite thin film
Carbone D., Pateras A.I., Bussone G., Evans P.G., Cornelius T.W., Bousquet M., Boulle A., Gautier B., Duclère J.R.,
Applied Physics Letters 105, 242901-1-242901-5 (2014)
Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping
Chahine G.A., Richard M.I., Homs-Regojo R.A., Tran-Caliste T.N., Carbone D., Jacques V.L.R., Grifone R., Boesecke P., Katzer J., Costina I., Djazouli H., Schroeder T., Schülli T.U.,
Journal of Applied Crystallography 47, 762-769 (2014)
Gold-free ternary III-V antimonide nanowire arrays on silicon: Twin-free down to the first bilayer
Conesa-Boj S., Kriegner D., Han X.L., Plissard S., Wallart X., Stangl J., Fontcuberta i Morral A., Caroff P.,
Nano Letters 14, 326-332 (2014)
In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques
Cornelius T.W., Ren Z., Mastropietro F., Langlais S., Davydok A., Richard M.I., Dupraz M., Verdier M., Beutier G., Boesecke P., Thomas O.,
MRS Proceedings 1712, 1-6 (2014)
Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges
Etzelstorfer T., Süess M.J., Schiefler G.L., Jacques V.L.R., Carbone D., Chrastina D., Isella G., Spolenak R., Stangl J., Sigg H., Diaz A.,
Journal of Synchrotron Radiation 21, 111-118 (2014)
3D heteroepitaxy of mismatched semiconductors on silicon
Falub C.V., Kreiliger T., Isa F., Taboada A.G., Meduna M., Pezzoli F., Bergamaschini R., Marzegalli A., Müller E., Chrastina D., Isella G., Neels A., Niedermann P., Dommann A., Miglio L., von Känel H.,
Thin Solid Films 557, 42-49 (2014)
Full-field X-ray diffraction microscopy using polymeric compound refractive lenses
Hilhorst J., Marschall F., Tran Thi T.N., Last A., Schülli T.U.,
Journal of Applied Crystallography 47, 1882-1888 (2014)
X-ray and neutron scattering
Kostorz G.,
In: "Physical Metallurgy (Fifth Edition)" Laughlin D.E. (Eds.) Hono K. (Eds.) (Elsevier, 2014) pp. 1227-1316
Influence of a low-temperature capping on the crystalline structure and morphology of InGaN quantum dot structures
Krause B., Miljevic B., Aschenbrenner T., Piskorska-Hommel E., Tessarek C., Barchuk M., Buth G., Donfeu Tchana R., Figge S., Gutowski J., Hänschke D., Kalden J., Laurus T., Lazarev S., Magalhães-Paniago R., Sebald K., Wolska A., Hommel D., Falta J., Holý V., Baumbach T.,
Journal of Alloys and Compounds 585, 572-579 (2014)
Epitaxial Ge-crystal arrays for X-ray detection
Kreiliger T., Falub C.V., Isa F., Isella G., Chrastina D., Bergamaschini R., Marzegalli A., Kaufmann R., Niedermann P., Neels A., Müller E., Meduna M., Dommann A., Miglio L., von Känel H.,
Journal of Instrumentation 9, C03019-1-C03019-8 (2014)
Crystal phase transitions in the shell of PbS/CdS core/shell nanocrystals influences photoluminescence intensity
Lechner R.T., Fritz-Popovski G., Yarema M., Heiss W., Hoell A., Schülli T.U., Primetzhofer D., Eibelhuber M., Paris O.,
Chemistry of Materials 26, 5914-5922 (2014)
Fine tuning of lithographic masks through thin films of PS-b-PMMA with different molar mass by rapid thermal processing
Lupi F.F., Giammaria T.J., Seguini G., Vita F., Francescangeli O., Sparnacci K., Antonioli D., Gianotti V., Laus M., Perego M.,
ACS Applied Materials & Interfaces 6, 7180-7188 (2014)
X-ray nano-diffraction on epitaxial crystals
Meduna M., Falub C.V., Isa F., Chrastina D., Kreiliger T., Isella G., Taboada A.G., Niedermann P., von Känel H.,
Quantum Matter 3, 290-296 (2014)
Reconstruction of crystal shapes by X-ray nanodiffraction from three-dimensional superlattices
Meduna M., Falub C.V., Isa F., Chrastina D., Kreiliger T., Isella G., von Känel H.,
Journal of Applied Crystallography 47, 2030-2037 (2014)
Nanostructure of biogenic calcite and its modification under annealing: Study by high-resolution X-ray diffraction and nanoindentation
Metzger T.H., Politi Y., Carbone G., Bayerlein B., Zlotnikov I., Zolotoyabko E., Fratzl P.,
Crystal Growth & Design 14, 5275-5282 (2014)
Dislocation engineering in SiGe on periodic and aperiodic Si(001) templates studied by fast scanning X-ray nanodiffraction
Mondiali V., Bollani M., Cecchi S., Richard M.I., Schülli T., Chahine G.A., Chrastina D.,
Applied Physics Letters 104, 021918-1-021918-5 (2014)
Strain release management in SiGe/Si films by substrate patterning
Mondiali V., Bollani M., Chrastina D., Rubert R., Chahine G., Richard M.I., Cecchi S., Gagliano L., Bonera E., Schülli T., Miglio L.,
Applied Physics Letters 105, 242103-1-242103-4 (2014)
Fully coherent growth of Ge on free-standing Si(001) nanomesas
Montalenti F., Salvalaglio M., Marzegalli A., Zaumseil P., Capellini G., Schülli T.U., Schubert M.A., Yamamoto Y., Tillack B., Schroeder T.,
Physical Review B 89, 014101-1-014101-7 (2014)
Scanning force microscope for in situ nanofocused X-ray diffraction studies
Ren Z., Mastropietro F., Davydok A., Langlais S., Richard M.I., Furter J.J., Thomas O., Dupraz M., Verdier M., Beutier G., Boesecke P., Cornelius T.W.,
Journal of Synchrotron Radiation 21, 1128-1133 (2014)
Thermally induced self-assembly of cylindrical nanodomains in low molecular weight PS-b-PMMA thin films
Seguini G., Giammaria T.J., Lupi F.F., Sparnacci K., Antonioli D., Gianotti V., Vita F., Placentino I.F., Hilhorst J., Ferrero C., Francescangeli O., Laus M., Perego M.,
Nanotechnology 25, 045301-1-045301-6 (2014)
Axial InAs/GaAs heterostructures on silicon in a nanowire geometry
Somaschini C., Biermanns A., Bietti S., Bussone G., Trampert A., Sanguinetti S., Riechert H., Pietsch U., Geelhaar L.,
Nanotechnology 25, 485602-1-485602-6 (2014)
New insights into single-grain mechanical behavior from temperature-dependent 3-D coherent X-ray diffraction
Vaxelaire N., Labat S., Cornelius T.W., Kirchlechner C., Keckes J., Schülli T., Thomas O.,
Acta Materialia 78, 46-55 (2014)
Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals
Beutier G., Verdier M., de Boissieu M., Gilles B., Livet F., Richard M.I., Cornelius T.W., Labat S., Thomas O.,
Journal of Physics : Conference Series 425, 132003-1-132003-5 (2013)
Strain inhomogeneity in copper islands probed by coherent X-ray diffraction
Beutier G., Verdier M., Parry G., Gilles B., Labat S., Richard M.I., Cornelius T., Lory P.F., Vu Hoang S., Livet F., Thomas O., de Boissieu M.,
Thin Solid Films 530, 120-124 (2013)
Distribution of zinc-blende twins and wurtzite segments in GaAs nanowires probed by X-ray nanodiffraction
Biermanns A., Carbone D., Breuer S., Jacques V.L.R., Schülli T., Geelhaar L., Pietsch U.,
Physica Status Solidi-Rapid Research Letters 7, 860-863 (2013)
Axial strain in GaAs/InAs core-shell nanowires
Biermanns A., Rieger T., Bussone G., Pietsch U., Grützmacher D., Lepsa M.I.,
Applied Physics Letters 102, 043109-1-043109-4 (2013)
Ageing dynamics of ion bombardment induced self-organization processes
Bikondoa O., Carbone D., Chamard V., Metzger T.H.,
Scientific Reports 3, 1850-1-1850-6 (2013)
Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams
Bussone G., Schott R., Biermanns A., Davydok A., Reuter D., Carbone G., Schülli T.U., Wieck A.D., Pietsch U.,
Journal of Applied Crystallography 46, 887-892 (2013)
In situ nanofocused X-ray diffraction combined with scanning probe microscopy
Cornelius T.W., Mastropietro F., Thomas O., Schülli T.U.,
In: "X-ray diffraction: Structure, Principles, and Applications" (Nova Science Publishers, 2013) pp. 223-259
Structural characterization of selectively grown multilayers with new high angular resolution and sub-millimeter spot-size X-ray diffractometer
Décobert J., Guillamet R., Mocuta C., Carbone G., Guerault H.,
Journal of Crystal Growth 370, 154-156 (2013)
AlGaInAs selective area growth for high-speed EAM-based PIC sources
Décobert J., Lagree P., Guerault H., Kazmierski C.,
, ()
In situ doping of catalyst-free InAs nanowires with Si: Growth, polytypism, and local vibrational modes of Si
Dimakis E., Ramsteiner M., Huang C.N., Trampert A., Davydok A., Biermanns A., Pietsch U., Riechert H., Geelhaar L.,
Applied Physics Letters 103, 143121-1-143121-5 (2013)
Structural diversity in iron oxide nanoparticle assemblies as directed by particle morphology and orientation
Disch S., Wetterskog E., Hermann R.P., Korolkov D., Busch P., Boesecke P., Lyon O., Vainio U., Salazar-Alvarez G., Bergström L., Brückel T.,
Nanoscale 5, 3969-3975 (2013)
Compact ultrahigh vacuum sample environments for x-ray nanobeam diffraction and imaging
Evans P.G., Chahine G.A., Grifone R., Jacques V.L.R., Spalenka J.W., Schülli T.U.,
Review of Scientific Instruments 84, 113903-1-113903-6 (2013)
Perfect crystals grown from imperfect interfaces
Falub C.V., Meduna M., Chrastina D., Isa F., Marzegalli A., Kreiliger T., Taboada A.G., Isella G., Miglio L., Dommann A., von Känel H.,
Scientific Reports 3, 2276-1-2276-6 (2013)
Thermal diffuse scattering as a probe of large-wave-vector phonons in silicon nanostructures
Gopalakrishnan G., Holt M.V., McElhinny K.M., Spalenka J.W., Czaplewski D.A., Schülli T.U., Evans P.G.,
Physical Review Letters 110, 205503-1-205503-5 (2013)
Micro-characterization and three dimensional modeling of very large waveguide arrays by selective area growth for photonic integrated circuits
Guillamet R., Lagay N., Mocuta C., Lagrée P.Y., Carbone G., Décobert J.,
Journal of Crystal Growth 370, 128-132 (2013)
Counting dislocations in microcrystals by coherent X-ray diffraction
Jacques V.L.R., Carbone D., Ghisleni R., Thilly L.,
Physical Review Letters 111, 065503-1-065503-5 (2013)
Nucleation and growth of group III-nitride nanowires
Knelangen M.
From: Humboldt-Universität zu Berlin, Germany (PhD Thesis),
2013
Unit cell structure of the wurtzite phase of GaP nanowires: X-ray diffraction studies and density functional theory calculations
Kriegner D., Assali S., Belabbes A., Etzelstorfer T., Holý V., Schülli T., Bechstedt F., Bakkers E.P.A.M., Bauer G., Stangl J.,
Physical Review B 88, 115315-1-115315-7 (2013)
Structural investigation of GaInP nanowires using X-ray diffraction
Kriegner D., Persson J.M., Etzelstorfer T., Jacobsson D., Wallentin J., Wagner J.B., Deppert K., Borgström M.T., Stangl J.,
Thin Solid Films 543, 100-105 (2013)
xrayutilities: A versatile tool for reciprocal space conversion of scattering data recorded with linear and area detectors
Kriegner D., Wintersberger E., Stangl J.,
Journal of Applied Crystallography 46, 1162-1170 (2013)
Time-dependent relaxation of strained silicon-on-insulator lines using a partially coherent X-ray nanobeam
Mastropietro F., Eymery J., Carbone G., Baudot S., Andrieu F., Favre-Nicolin V.,
Physical Review Letters 111, 215502-1-215502-5 (2013)
X-ray diffraction imaging of metal–oxide epitaxial tunnel junctions made by optical lithography: Use of focused and unfocused X-ray beams
Mocuta C., Barbier A., Stanescu S., Matzen S., Moussy J.B., Ziegler E.,
Journal of Synchrotron Radiation 20, 355-365 (2013)
Etude des ondes de densité de charge par diffraction cohérente des rayons X (Charge density Wave studied by coherent X-ray diffraction)
Pinsolle E.
From: Université Paris Sud, France PhD Thesis,
2013
Dense TiO2 films grown by sol-gel dip coating on glass, F-doped SnO2, and silicon substrates
Procházka J., Kavan L., Zukalová M., Janda P., Jirkovsky J., Zivcova Z.V., Poruba A., Bedu M., Dobbelin M., Tena-Zaera R.,
Journal of Materials Research 28, 385-393 (2013)
Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures
Renevier H., Proietti M.G.,
In: "Characterization of Semiconductor Heterostructures and Nanostructures. 2. Edition" Lamberti C. (Eds.) Agostini G. (Eds.) (Elsevier, 2013) pp. 311-359
Intergrowth structure and aluminium zoning of a zeolite ZSM-5 crystal as resolved by synchrotron-based micro X-ray diffraction imaging
Ristanović Z., Hofmann J.P., Deka U., Schülli T.U., Rohnke M., Beale A.M., Weckhuysen B.M.,
Angewandte Chemie International Edition 52, 13382-13386 (2013)
Nanostructures observed by surface sensitive X-ray scattering and highly focused beams
Schülli T., Favre-Nicolin V., Richard M.I., Renaud G.,
In: "Characterization of Semiconductor Heterostructures and Nanostructures. 2. Edition" Lamberti C. (Eds.) Agostini G. (Eds.) (Elsevier, 2013) pp. 113-173
X-ray characterization of Ge dots epitaxially grown on nanostructured Si islands on silicon-on-insulator substrates
Zaumseil P., Kozlowski G., Yamamoto Y., Schubert M.A., Schroeder T.,
Journal of Applied Crystallography 46, 868-873 (2013)
Stalk structures in lipid bilayer fusion studied by x-ray diffraction
Aeffner S.
From: University of Göttingen, Germany (PhD Thesis),
2012
Energetics of stalk intermediates in membrane fusion are controlled by lipid composition
Aeffner S., Reusch T., Weinhausen B., Salditt T.,
Proceedings of the National Academy of Sciences of the USA 109, E1609-E1618 (2012)
Nanoscale study of the current transport through transrotational NiSi/n-Si contacts by conductive atomic force microscopy
Alberti A., Giannazzo F.,
Applied Physics Letters 101, 261906-1-261906-4 (2012)
Assembled nanostructured architectures studied by grazing incidence X-ray scattering
Altamura D., Sibillano T., Siliqi D., De Caro L., Giannini C.,
Nanomaterials and Nanotechnology 2, 16-2012-1-16-2012-23 (2012)
Quantitative analysis of nanoripple and nanoparticle patterns by grazing incidence small-angle x-ray scattering 3D mapping
Babonneau D., Camelio S., Vandenhecke E., Rousselet S., Garel M., Pailloux F., Boesecke P.,
Physical Review B 85, 235415-1-235415-11 (2012)
Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single-nanowire X-ray diffraction
Biermanns A., Breuer S., Davydok A., Geelhaar L., Pietsch U.,
Journal of Applied Crystallography 45, 239-244 (2012)
In situ three-dimensional reciprocal-space mapping during mechanical deformation
Cornelius T.W., Davydok A., Jacques V.L.R., Grifone R., Schülli T., Richard M.I., Beutier G., Verdier M., Metzger T.H., Pietsch U., Thomas O.,
Journal of Synchrotron Radiation 19, 688-694 (2012)
Lattice parameter accommodation between GaAs(111) nanowires and Si (111) substrate after growth via Au-assisted molecular beam epitaxy
Davydok A., Breuer S., Biermanns A., Geelhaar L., Pietsch U.,
Nanoscale Research Letters 7, 109-1-109-7 (2012)
A superbright X-ray laboratory microsource empowered by a novel restoration algorithm
De Caro L., Altamura D., Vittoria F.A., Carbone G., Qiao F., Manna L., Giannini C.,
Journal of Applied Crystallography 45, 1228-1235 (2012)
Solution-processable septithiophene monolayer transistor
Defaux M., Gholamrezaie F., Wang J., Kreyes A., Ziener U., Anokhin D.V., Ivanov D.A., Moser A., Neuhold A., Salzmann I., Resel R., de Leeuw D.M., Meskers S.C.J., Moeller M., Mourran A.,
Advanced Materials 24, 973-978 (2012)
Nanoscale distortions of Si quantum wells in Si/SiGe quantum-electronic heterostructures
Evans P.G., Savage D.E., Prance J.R., Simmons C.B., Lagally M.G., Coppersmith S.N., Eriksson M.A., Schülli T.U.,
Advanced Materials 24, 5217-5221 (2012)
Space-filling arrays of three-dimensional epitaxial Ge and Si1-xGex crystals
Falub C.V., Isa F., Kreiliger T., Bergamaschini R., Marzegalli A., Taboada A.G., Chrastina D., Isella G., Müller E., Niedermann P., Dommann A., Neels A., Pezous A., Meduna M., Miglio L., von Känel H.,
, ()
Three dimensional heteroepitaxy: A new path for monolithically integrating mismatched materials with silicon
Falub C.V., Kreiliger T., Taboada A.G., Isa F., Chrastina D., Isella G., Müller E., Meduna M., Bergamaschini R., Marzegalli A., Bonera E., Pezzoli F., Miglio L., Niedermann P., Neels A., Pezous A., Kaufmann R., Dommann A., von Känel H.,
, ()
Scaling hetero-epitaxy from layers to three-dimensional crystals
Falub C.V., von Känel H., Isa F., Bergamaschini R., Marzegalli A., Chrastina D., Isella G., Müller E., Niedermann P., Miglio L.,
Science 335, 1330-1334 (2012)
Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures
Favre-Nicolin V., Proietti M.G., Leclere C., Katcho N.A., Richard M.I., Renevier H.,
European Physical Journal Special Topics 208, 189-216 (2012)
Metastable phase formation and structural evolution of epitaxial graphene grown on SiC(100) under a temperature gradient
Goncalves A.M.B., Malachias A., Mazzoni M.S., Lacerda R.G., Magalhães-Paniago R.,
Nanotechnology 23, 175603-1-175603-9 (2012)
Surface phase transitions in BiFeO3 below room temperature
Jarrier R., Martí X., Herrero-Albillos J., Ferrer P., Haumont R., Gemeiner P., Geneste G., Berthet P., Schülli T., Cevc P., Blinc R., Wong S.S., Park T.J., Alexe M., Carpenter M.A., Scott J.F., Catalan G., Dkhil B.,
Physical Review B 85, 184104-1-184104-10 (2012)
Growth and relaxation processes in Ge nanocrystals on free-standing Si(001) nanopillars
Kozlowski G., Zaumseil P., Schubert M.A., Yamamoto Y., Bauer J., Schülli T.U., Tillack B., Schroeder T.,
Nanotechnology 23, 115704-1-115704-7 (2012)
Focused ion beam induced structural modifications in thin magnetic films
Roshchupkina O.D., Grenzer J., Strache T., McCord J., Fritzsche M., Mücklich A., Baehtz C., Fassbender J.,
Journal of Applied Physics 112, 033901-1-033901-7 (2012)